On the influence of fabrication tolerances in Terahertz photoconductive antennas

© 2025 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes,creating new collective works, for resale or redistribution to se...

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Detalles Bibliográficos
Autores: Vega Piña, Sara|||0000-0002-4853-7929, Nuño Gómez, Daniel-Juan|||0000-0002-2418-6351, Chang, Yi, Gómez Díaz, J. Sebastián, Santos Blanco, M. Concepción|||0000-0002-5103-5356
Tipo de recurso: artículo
Fecha de publicación:2025
País:España
Institución:Universitat Politècnica de Catalunya (UPC)
Repositorio:UPCommons. Portal del coneixement obert de la UPC
Idioma:inglés
OAI Identifier:oai:upcommons.upc.edu:2117/428594
Acceso en línea:https://hdl.handle.net/2117/428594
https://dx.doi.org/10.1109/TTHZ.2025.3558962
Access Level:acceso abierto
Palabra clave:Substrates
Principal component analysis
Antenna radiation patterns
Dipole antennas
Antenna measurements
Terahertz radiation
Lenses
Geometry
Fabrication
Semiconductor device measurement
Photoconductive antennas
Substrate lens
Thz spectrometry.
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Sumario:© 2025 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes,creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.