Determination of the complex permittivity of each layer for a bi-layer dielectric material using transmission (ABCD) matrix in Ku-Band frequency
A new technique is presented to determine the complex permittivity of each layer for a bi-layer dielectric material. The bilayer material sample is loaded in a Ku-band rectangular waveguide WR62 and its two port S-parameters are measured as a function of frequency using the E8634A Network Analyzer....
| Autores: | , , , , |
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| Tipo de documento: | artigo |
| Data de publicação: | 2016 |
| País: | España |
| Recursos: | Universidad de Cantabria (UC) |
| Repositório: | UCrea Repositorio Abierto de la Universidad de Cantabria |
| Idioma: | inglês |
| OAI Identifier: | oai:repositorio.unican.es:10902/9355 |
| Acesso em linha: | http://hdl.handle.net/10902/9355 |
| Access Level: | Acceso aberto |
| Palavra-chave: | Complex permittivity Microwave Transmission ABCD matrix Dielectric material Optimizations methods |
| Resumo: | A new technique is presented to determine the complex permittivity of each layer for a bi-layer dielectric material. The bilayer material sample is loaded in a Ku-band rectangular waveguide WR62 and its two port S-parameters are measured as a function of frequency using the E8634A Network Analyzer. Also, by applying transmission (ABCD) matrix, expressions for the S-parameters of the bi-layer dielectric material as a function of complex permittivity of each layer are developed. To estimate the complex permittivity of each layer’s dielectric material, the square sums of errors between the measured and calculated S-parameters are minimised using a nonlinear optimization algorithm. The complex permittivity of each layer for a bi-layer dielectric material such as FR4-Teflon, FR4-Delrin and Delrin-Teflon are determined at the Ku-band frequencies, and the average relative errors between the individual dielectric materials and those of each individual layer of the bi-layer dielectric materials are calculated. |
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