An accurate method to estimate complex permittivity of dielectric materials at X-band frequencies
In this paper, a measurement method is presented to estimate the complex permittivity of a dielectric material even if its length is higher than the half wavelength in the waveguide. The Sij-parameters at reference planes in the rectangular waveguide loaded by material sample are measured by Network...
| Autores: | , , , |
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| Tipo de documento: | artigo |
| Data de publicação: | 2020 |
| País: | España |
| Recursos: | Universidad de Cantabria (UC) |
| Repositório: | UCrea Repositorio Abierto de la Universidad de Cantabria |
| Idioma: | inglês |
| OAI Identifier: | oai:repositorio.unican.es:10902/18653 |
| Acesso em linha: | http://hdl.handle.net/10902/18653 |
| Access Level: | Acceso aberto |
| Palavra-chave: | Characterization Complex permittivity Nicholson-Ross method Microwave Waveguide |
| Resumo: | In this paper, a measurement method is presented to estimate the complex permittivity of a dielectric material even if its length is higher than the half wavelength in the waveguide. The Sij-parameters at reference planes in the rectangular waveguide loaded by material sample are measured by Network Analyzer. First of all, the expression of the complex permittivity as a function of Sij-parameters are calculated by applying the transmission lines theory. Further, a comparison of the estimated values of the complex permittivity obtained from the presented method and the Nicholson-Ross method is presented. Finally, the results for complex permittivity of Teflon, Nylon and Verde measured at the X-band frequencies are presented. |
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