Secondary electron emission yield of Teflon®, Kapton®, RT/Duroid® and ferrite under induced surface charging states
[EN] Dielectric materials are increasingly common in modern satellite payloads due to their advantageous properties, such as the large mass and volume reduction can be achieved when they are used in radiofrequency (RF) equipment. However, the presence of dielectric materials in the output high-power...
| Autores: | , , , , , |
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| Tipo de recurso: | artículo |
| Fecha de publicación: | 2025 |
| País: | España |
| Institución: | Universitat Politècnica de València (UPV) |
| Repositorio: | RiuNet. Repositorio Institucional de la Universitat Politécnica de Valéncia |
| Idioma: | inglés |
| OAI Identifier: | oai:riunet.upv.es:10251/232277 |
| Acceso en línea: | https://riunet.upv.es/handle/10251/232277 |
| Access Level: | acceso abierto |
| Palabra clave: | Secondary electron emission yield Charging states Space materials Electrical resistivity Multipactor involving dielectrics |
| Sumario: | [EN] Dielectric materials are increasingly common in modern satellite payloads due to their advantageous properties, such as the large mass and volume reduction can be achieved when they are used in radiofrequency (RF) equipment. However, the presence of dielectric materials in the output high-power section of RF payloads requires careful study of their influence on the multipactor performance, and therefore, their secondary electron emission yield (SEY). This characterization in dielectrics is nowadays a challenging and time-consuming practice relying on the electrical charge neutralization before each measurement. However, surface charging of dielectrics can be developed during the satellite operation and can significantly influence their SEY properties, thereby affecting the multipactor threshold. For the first time, this study succeeds in providing the experimental SEY curves of Teflon (R), Kapton (R), Rogers RT/Duroid (R), and Ferrite under controlled and induced surface charging states. These materials were studied due to their common employment in satellite communication devices. Using an electron gun working in combination with a Kelvin probe system, it was possible to characterize the SEY characteristics of the materials after inducing different charge levels on their surface. From the results, it can be concluded that surface charging has a significant effect in lowering the SEY levels. Nevertheless, this effect could only be observed in materials with high electrical resistivity, since the surface charge rapidly dissipated in materials with lower electrical resistivity before the SEY measurement took place. Therefore, these findings provide valuable insights into the design and optimization of dielectric materials for space applications, giving an accurate overview of their SEY response under possible charging states in orbit. |
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