Study of the Secondary Electron Yield in Dielectrics Using Equivalent Circuital Models

[EN] Secondary electron emission has an important role on the triggering of the multipactor effect; therefore, its study and characterization are essential in radio-frequency waveguide applications. In this paper, we propose a theoretical model, based on equivalent circuit models, to properly unders...

Descripción completa

Detalles Bibliográficos
Autores: Bañón, David, Socuellamos, J. M., Mata-Sanz, Rafael, Mercadé-Morales, Laura, Gimeno Martínez, Benito, Raboso García-Baquero, David, Semenov, V., Rakova, E.I, Sánchez-Royo, J. F., Segura García del Río, Alfredo, Boria Esbert, Vicente Enrique|||0000-0001-7150-9785
Tipo de recurso: artículo
Fecha de publicación:2018
País:España
Institución:Universitat Politècnica de València (UPV)
Repositorio:RiuNet. Repositorio Institucional de la Universitat Politécnica de Valéncia
Idioma:inglés
OAI Identifier:oai:riunet.upv.es:10251/121371
Acceso en línea:https://riunet.upv.es/handle/10251/121371
Access Level:acceso abierto
Palabra clave:Multipactor effect
Radio frequency
Secondary electron emission (SEE)
Secondary electron yield
TEORIA DE LA SEÑAL Y COMUNICACIONES
Descripción
Sumario:[EN] Secondary electron emission has an important role on the triggering of the multipactor effect; therefore, its study and characterization are essential in radio-frequency waveguide applications. In this paper, we propose a theoretical model, based on equivalent circuit models, to properly understand charging and discharging processes that occur in dielectric samples under electron irradiation for secondary electron emission characterization. Experimental results obtained for Pt, Si, GaS, and Teflon samples are presented to verify the accuracy of the proposed model. Good agreement between theory and experiments has been found.

Similares en LA Referencia