Persistent Luminescence Analysis in the Frequency Domain

Frequency-domain techniques offer a powerful means to disentangle overlapping physical processes with distinct characteristic timescales—yet remain underexplored in the context of complex photoluminescent materials. Here, frequency-domain analysis is applied to persistent luminescence (PersL) materi...

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Detalles Bibliográficos
Autores: Romero Aguilar, Manuel, Castaing, Victor, Rytz, Daniel, Lozano, Gabriel, Míguez, Hernán
Tipo de recurso: artículo
Estado:Versión publicada
Fecha de publicación:2025
País:España
Institución:Consejo Superior de Investigaciones Científicas (CSIC)
Repositorio:DIGITAL.CSIC. Repositorio Institucional del CSIC
OAI Identifier:oai:digital.csic.es:10261/400160
Acceso en línea:http://hdl.handle.net/10261/400160
Access Level:acceso abierto
Palabra clave:Afterglow
Efficiency
Frequency analysis
Long-lasting luminescence
Persistent luminiscence
Phosphors
Trapping
luminescence
Descripción
Sumario:Frequency-domain techniques offer a powerful means to disentangle overlapping physical processes with distinct characteristic timescales—yet remain underexplored in the context of complex photoluminescent materials. Here, frequency-domain analysis is applied to persistent luminescence (PersL) materials, which exhibit long-lasting emission following excitation due to charge trapping and detrapping processes spanning wide temporal ranges. Using SrAl2O4:Eu2⁺,Dy3⁺ (SAO:Eu,Dy) as a model system, a general framework is developed for frequency-domain characterization of PersL and reports, for the first time, a direct measurement of the trapping rate in such a material. This approach also enables quantitative assessment of trapping probability, efficiency, and overall PersL performance. This work opens a new pathway for rational optimization of afterglow materials based on mechanistic insights beyond conventional time-domain approaches.