Persistent Luminescence Analysis in the Frequency Domain
Frequency-domain techniques offer a powerful means to disentangle overlapping physical processes with distinct characteristic timescales—yet remain underexplored in the context of complex photoluminescent materials. Here, frequency-domain analysis is applied to persistent luminescence (PersL) materi...
| Autores: | , , , , |
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| Tipo de recurso: | artículo |
| Estado: | Versión publicada |
| Fecha de publicación: | 2025 |
| País: | España |
| Institución: | Consejo Superior de Investigaciones Científicas (CSIC) |
| Repositorio: | DIGITAL.CSIC. Repositorio Institucional del CSIC |
| OAI Identifier: | oai:digital.csic.es:10261/400160 |
| Acceso en línea: | http://hdl.handle.net/10261/400160 |
| Access Level: | acceso abierto |
| Palabra clave: | Afterglow Efficiency Frequency analysis Long-lasting luminescence Persistent luminiscence Phosphors Trapping luminescence |
| Sumario: | Frequency-domain techniques offer a powerful means to disentangle overlapping physical processes with distinct characteristic timescales—yet remain underexplored in the context of complex photoluminescent materials. Here, frequency-domain analysis is applied to persistent luminescence (PersL) materials, which exhibit long-lasting emission following excitation due to charge trapping and detrapping processes spanning wide temporal ranges. Using SrAl2O4:Eu2⁺,Dy3⁺ (SAO:Eu,Dy) as a model system, a general framework is developed for frequency-domain characterization of PersL and reports, for the first time, a direct measurement of the trapping rate in such a material. This approach also enables quantitative assessment of trapping probability, efficiency, and overall PersL performance. This work opens a new pathway for rational optimization of afterglow materials based on mechanistic insights beyond conventional time-domain approaches. |
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