Ferromagnetic resonance of fe(111)/cu(111)multilayers

Ferromagnetic resonance at 9.4 GHz has been used to characterize several samples of Fe sing1e-crystal films and Fe/Cu multilayers prepared by electron-beam deposition on HF-etched, hydrogen-terminated Si(111). Resonance field data as a function of the field orientation in the film plane confirmed th...

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Bibliographic Details
Authors: Rezende, Sergio Machado, Moura, J.A.S., Aguiar, F.M. de, Schreiner, Wido Herwig
Format: article
Status:Published version
Publication Date:1994
Country:Brasil
Institution:Universidade Federal do Rio Grande do Sul (UFRGS)
Repository:Repositório Institucional da UFRGS
Language:English
OAI Identifier:oai:www.lume.ufrgs.br:10183/104217
Online Access:http://hdl.handle.net/10183/104217
Access Level:Open access
Keyword:Física da matéria condensada
Ressonancia ferromagnetica
Cristalinidade
Filmes finos magneticos
Anisotropia magnética
Crescimento epitaxial
Feixes de eletrons
Description
Summary:Ferromagnetic resonance at 9.4 GHz has been used to characterize several samples of Fe sing1e-crystal films and Fe/Cu multilayers prepared by electron-beam deposition on HF-etched, hydrogen-terminated Si(111). Resonance field data as a function of the field orientation in the film plane confirmed that Fe films and Fe/Cu multilayers grow epitaxially on Si(111) with excellent crystallinity in the [111] orientation. Moreover, we have found that the (111) plane is unique among the principal planes in cubic crystals, because it allows precise measurements of the small second-order and in-plane anisotropies as well as misorientations from the crystal plane.