Ferromagnetic resonance of fe(111)/cu(111)multilayers
Ferromagnetic resonance at 9.4 GHz has been used to characterize several samples of Fe sing1e-crystal films and Fe/Cu multilayers prepared by electron-beam deposition on HF-etched, hydrogen-terminated Si(111). Resonance field data as a function of the field orientation in the film plane confirmed th...
| Autores: | , , , |
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| Tipo de recurso: | artículo |
| Estado: | Versión publicada |
| Fecha de publicación: | 1994 |
| País: | Brasil |
| Institución: | Universidade Federal do Rio Grande do Sul (UFRGS) |
| Repositorio: | Repositório Institucional da UFRGS |
| Idioma: | inglés |
| OAI Identifier: | oai:www.lume.ufrgs.br:10183/104217 |
| Acceso en línea: | http://hdl.handle.net/10183/104217 |
| Access Level: | acceso abierto |
| Palabra clave: | Física da matéria condensada Ressonancia ferromagnetica Cristalinidade Filmes finos magneticos Anisotropia magnética Crescimento epitaxial Feixes de eletrons |
| Sumario: | Ferromagnetic resonance at 9.4 GHz has been used to characterize several samples of Fe sing1e-crystal films and Fe/Cu multilayers prepared by electron-beam deposition on HF-etched, hydrogen-terminated Si(111). Resonance field data as a function of the field orientation in the film plane confirmed that Fe films and Fe/Cu multilayers grow epitaxially on Si(111) with excellent crystallinity in the [111] orientation. Moreover, we have found that the (111) plane is unique among the principal planes in cubic crystals, because it allows precise measurements of the small second-order and in-plane anisotropies as well as misorientations from the crystal plane. |
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