Luminescence properties of Yb3+-Tb3+ co-doped amorphous silicon oxycarbide thin films

This work was supported by the Peruvian science foundation CIENCIACTIVA of CONCYTEC and DAAD-CONCYTEC project (2017–2019). The Research Management Office (DGI) of the the Pontificia Universidad Católica del Perú (PUCP) project 492-2017. The research activity was performed in the framework of the doc...

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Detalhes bibliográficos
Autores: Flores L.F., Tucto K.Y., Guerra J.A., Töfflinger J.A., Serquen E.S., Osvet A., Batentschuk M., Winnacker A., Grieseler R., Weingärtner R.
Tipo de documento: artigo
Data de publicação:2019
País:Perú
Recursos:Consejo Nacional de Ciencia Tecnología e Innovación
Repositório:CONCYTEC-Institucional
Idioma:inglês
OAI Identifier:oai:repositorio.concytec.gob.pe:20.500.12390/683
Acesso em linha:https://hdl.handle.net/20.500.12390/683
https://doi.org/10.1016/j.optmat.2019.04.003
Access Level:Acceso aberto
Palavra-chave:Ytterbium alloys
Amorphous films
Annealing
Binary alloys
Chemical activation
Energy dispersive spectroscopy
Energy transfer
Fourier transform infrared spectroscopy
Luminescence of inorganic solids
Photoluminescence
Rare earths
Silicon carbide
Silicon compounds
Terbium
Terbium alloys
Thin films
Ytterbium
Amorphous silicon oxycarbide
Energy dispersive X ray spectroscopy
Photoluminescence decay curves
Photoluminescence excitation spectrum
Photoluminescence intensities
Photoluminescence lifetime
rf-Magnetron sputtering
Silicon oxycarbides
Amorphous silicon
https://purl.org/pe-repo/ocde/ford#1.03.00
Descrição
Resumo:This work was supported by the Peruvian science foundation CIENCIACTIVA of CONCYTEC and DAAD-CONCYTEC project (2017–2019). The Research Management Office (DGI) of the the Pontificia Universidad Católica del Perú (PUCP) project 492-2017. The research activity was performed in the framework of the doctoral scholarship of L. F. Flores under the contract number 236-2015-FONDECYT. The authors are also thankful to the Center of Materials Characterization (CAM) and the Institute of Corrosion and Protection (ICP) of the PUCP for the EDX, PL and FTIR measurements.

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