Texture Quantification in Y Ba 2 Cu 3 O 7 Superconducting Films
Y Ba2Cu3O7 epitaxial superconducting film is consequence of an optimum epitaxial growth process of superconducting grains. Also, the substrate's epitaxy has a direct repercussion on the lm microstructure and its physical properties. Conventional characterization techniques such as: scanning ele...
| Autores: | , , , , , |
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| Formato: | artículo |
| Estado: | Versión publicada |
| Fecha de publicación: | 2020 |
| País: | Perú |
| Recursos: | Universidad Nacional Mayor de San Marcos |
| Repositorio: | Revistas - Universidad Nacional Mayor de San Marcos |
| Idioma: | español |
| OAI Identifier: | oai:revistasinvestigacion.unmsm.edu.pe:article/20293 |
| Acesso em linha: | https://revistasinvestigacion.unmsm.edu.pe/index.php/fisica/article/view/20293 |
| Access Level: | acceso abierto |
| Palavra-chave: | Epitaxy Texture scanning electronic microscopy X-ray diffraction Epitaxia Textura Microscopía electrónica de barrido difracción de rayos X |
| Resumo: | Y Ba2Cu3O7 epitaxial superconducting film is consequence of an optimum epitaxial growth process of superconducting grains. Also, the substrate's epitaxy has a direct repercussion on the lm microstructure and its physical properties. Conventional characterization techniques such as: scanning electronic microscopy, and x ray difrraction, allowed us to obtain a quick assessment of epitaxy quality through of texture quantification of the film. We present the results of texture quantification in Y Ba2Cu3O7 superconducting films. |
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