Dependability Evaluation of COTS Microprocessors via On-Chip debugging facilities

This paper presents a fault injection tool and methodology for performing Single-Event-Upsets (SEUs) injection campaigns on Commercial-off-the-shelf (COTS) microprocessors. This method takes advantage of the debug facilities of modern microprocessors along with standard GNU Debugger (GDB) for execut...

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Detalles Bibliográficos
Autores: Isaza-González, José, Serrano-Cases, Alejandro, Restrepo-Calle, Felipe, Cuenca-Asensi, Sergio, Martínez-Álvarez, Antonio
Tipo de recurso: artículo
Estado:Versión publicada
Fecha de publicación:2017
País:Panamá
Institución:Universidad Tecnológica de Panamá
Repositorio:Repositorio Institucional de documento digitales de acceso abierto de la UTP
Idioma:español
OAI Identifier:oai:ridda2.utp.ac.pa:123456789/1781
Acceso en línea:http://revistas.utp.ac.pa/index.php/id-tecnologico/article/view/1432
http://ridda2.utp.ac.pa/handle/123456789/1781
Access Level:acceso abierto
Palabra clave:Commercial-off-the-shelf (COTS); on-chip debug; radiation effects; microprocessors reliability; fault injection; soft-error
Commercial-off-the-shelf (COTS); depuración integrada en el chip; efectos de la radiación; fiabilidad de microprocesadores; inyección de fallos; errores lógicos
Descripción
Sumario:This paper presents a fault injection tool and methodology for performing Single-Event-Upsets (SEUs) injection campaigns on Commercial-off-the-shelf (COTS) microprocessors. This method takes advantage of the debug facilities of modern microprocessors along with standard GNU Debugger (GDB) for executing and debugging benchmarks. The developed experiments on real boards, as well as on virtual machines, demonstrate the feasibility and flexibility of the proposal as a low-cost solution for assessing the reliability of COTS microprocessors