Sistemas de detección de valor RMS para señales en sistemas inalámbricos
Today, on-chip testing of circuits and systems has begun to be very important for engineers. Testing Systems On Chip (SoCs) is currently in research, development and innovation. In contrast with digital systems, in analogue systems (particularly wireless communication systems such as microwave, RF,...
| Autor: | |
|---|---|
| Tipo de recurso: | tesis de maestría |
| Estado: | Versión aceptada para publicación |
| Fecha de publicación: | 2009 |
| País: | México |
| Institución: | Instituto Nacional de Astrofísica, Óptica y Electrónica |
| Repositorio: | Repositorio Institucional del INAOE |
| Idioma: | español |
| OAI Identifier: | oai:inaoe.repositorioinstitucional.mx:1009/397 |
| Acceso en línea: | http://inaoe.repositorioinstitucional.mx/jspui/handle/1009/397 |
| Access Level: | acceso abierto |
| Palabra clave: | info:eu-repo/classification/Circuitos integrados analógicos/Analogue integrated circuits info:eu-repo/classification/Procesamiento de circuitos analógicos/Analogue processing circuits info:eu-repo/classification/Multiplicadores analógicos/Analogue multipliers info:eu-repo/classification/cti/1 info:eu-repo/classification/cti/22 info:eu-repo/classification/cti/2203 |
| Sumario: | Today, on-chip testing of circuits and systems has begun to be very important for engineers. Testing Systems On Chip (SoCs) is currently in research, development and innovation. In contrast with digital systems, in analogue systems (particularly wireless communication systems such as microwave, RF, etc.) the test is more complex due to the low voltage range and density of thermal noise at the frequencies to which are used. Currently, several techniques have been proposed to test systems for RF wireless communications, where Built-In Testing (BIT) techniques have proved to be the most useful. In works reported recently, the use of the RMS value of signals in communication systems has been used in test systems, performance optimization and bug fixes. Since a RMS detector generates a DC value proportional to the amplitude or power of an input signal, its use in environments with high contamination of thermal noise allows to discriminate between the power that such noise brings and that comes from the signal of interest. Following this trend, this thesis develops a prototype detector circuit RF-RMS, a proposal to level system of RMS estimator from homogeneous delays which also describes the delay circuit, driver circuit and also are generated four new circuit topologies of analog dividers, based in a standard 0.35μm CMOS technology. |
|---|