Análisis y aplicaciones del interferómetro con filo de la navaja: lentes con sistema 2f, y superficies cóncavas reflectoras
This thesis work continues with the implementation of the Knife Edge Interferometer (KEI), using the configuration 2f to measure the optical quality of lenses and spherical and parabolic concave reflective surfaces; eliminating the collimator system previously used, so that this system becomes an ec...
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| Tipo de documento: | tese |
| Estado: | Versión aceptada para publicación |
| Data de publicação: | 2019 |
| País: | México |
| Recursos: | Instituto Nacional de Astrofísica, Óptica y Electrónica |
| Repositório: | Repositorio Institucional del INAOE |
| Idioma: | espanhol |
| OAI Identifier: | oai:inaoe.repositorioinstitucional.mx:1009/1840 |
| Acesso em linha: | http://inaoe.repositorioinstitucional.mx/jspui/handle/1009/1840 |
| Access Level: | Acceso aberto |
| Palavra-chave: | info:eu-repo/classification/Inspec/Testing lens and reflecting concave surface info:eu-repo/classification/Inspec/Interferometry info:eu-repo/classification/Inspec/Optical metrology info:eu-repo/classification/cti/1 info:eu-repo/classification/cti/22 info:eu-repo/classification/cti/2209 |
| Resumo: | This thesis work continues with the implementation of the Knife Edge Interferometer (KEI), using the configuration 2f to measure the optical quality of lenses and spherical and parabolic concave reflective surfaces; eliminating the collimator system previously used, so that this system becomes an economical and versatile one; since we only require a knife to produce the wavefront by diffraction of the edge of the razor’s edge, and the test wavefront from the elements under test. This interferometer is classified as common trajectories, with self-reference, similar to the Linnik interferometer (IDP). Obtaining the interferograms using the KEI are partial due to the obstruction of the knife, so the method we use to obtain the remaining part, is rotating the knife 180°. Once the remaining part is obtained, we join the two partial interferograms by means of stitching them with computer programs from Matlab, thus obtaining the complete interferogram. Subsequently we analyze the interferograms using the commercial APEX program, obtaining quantitative results on the optical quality from the values of the aberrations, in terms of the wavelength of the light source used. |
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