Algorithm for Ronchigram recovery with random aberrations coefficients
We present the validation for Ronchigram recovery with the random aberrations coefficients (ReRRCA) algorithm. This algorithm was proposed to obtain the wavefront aberrations of synthetic Ronchigrams, using only one Ronchigram without the need for polynomial fits or trapezoidal integrations. The val...
| Autores: | , , , , , |
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| Tipo de recurso: | artículo |
| Estado: | Versión aceptada para publicación |
| Fecha de publicación: | 2013 |
| País: | México |
| Institución: | Instituto Nacional de Astrofísica, Óptica y Electrónica |
| Repositorio: | Repositorio Institucional del INAOE |
| Idioma: | inglés |
| OAI Identifier: | oai:inaoe.repositorioinstitucional.mx:1009/2173 |
| Acceso en línea: | http://inaoe.repositorioinstitucional.mx/jspui/handle/1009/2173 |
| Access Level: | acceso abierto |
| Palabra clave: | info:eu-repo/classification/Inspec/Ronchi test info:eu-repo/classification/Inspec/Aberration coefficients info:eu-repo/classification/Inspec/Genetic algorithm info:eu-repo/classification/Inspec/Images processing info:eu-repo/classification/Inspec/Lateral shear interferometry info:eu-repo/classification/cti/1 info:eu-repo/classification/cti/22 info:eu-repo/classification/cti/2209 |
| Sumario: | We present the validation for Ronchigram recovery with the random aberrations coefficients (ReRRCA) algorithm. This algorithm was proposed to obtain the wavefront aberrations of synthetic Ronchigrams, using only one Ronchigram without the need for polynomial fits or trapezoidal integrations. The validation is performed by simulating different types of Ronchigrams for on-axis and off-axis surfaces. In order to validate the proposed analysis, the polynomial aberration coefficients that were used to generate the simulated Ronchigrams were retrieved. Therefore, it was verified that the coefficients correspond to the retrieved ones by the algorithm. The results show that the ReRRCA algorithm retrieves the aberration coefficients from the analyzed Ronchigram with a maximum error of 9%. © 2013 Society of Photo-Optical Instrumentation Engineers (SPIE) [DOI: 10.1117/1.OE.52.5.053606] |
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