Synchrotron radiation study of the uranium chemical species electrodeposited for alpha spectrometry sources
Alpha spectrometry (AS) with semiconductor detectors has applications in nuclear decay data measurements, environmental, geological and nuclear wastes studies and other works requiring determination of actinide and other alpha emitter contents. In order to obtain accurate measurements by producing g...
| Autores: | , , , |
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| Tipo de recurso: | artículo |
| Estado: | Versión enviada para evaluación y publicación |
| Fecha de publicación: | 2011 |
| País: | México |
| Institución: | Centro de Investigación en Materiales Avanzados |
| Repositorio: | Fuente de Objetos Científicos Open Access del CIMAV |
| Idioma: | inglés |
| OAI Identifier: | oai:cimav.repositorioinstitucional.mx:1004/1853 |
| Acceso en línea: | http://cimav.repositorioinstitucional.mx/jspui/handle/1004/1853 |
| Access Level: | acceso abierto |
| Palabra clave: | info:eu-repo/classification/Gracing incidence/Uranium info:eu-repo/classification/X-ray absorption fine structure/X-ray diffraction info:eu-repo/classification/cti/1 info:eu-repo/classification/cti/22 info:eu-repo/classification/cti/2299 info:eu-repo/classification/cti/229999 |
| Sumario: | Alpha spectrometry (AS) with semiconductor detectors has applications in nuclear decay data measurements, environmental, geological and nuclear wastes studies and other works requiring determination of actinide and other alpha emitter contents. In order to obtain accurate measurements by producing good resolution alpha spectra, AS sources must be thin and uniform. AS sources produced by electrodeposition consist of a radioactive deposit onto a metallic substrate (cathode of the electrolytic cell). Natural U sources prepared by the Hallstadius method have co-deposited Pt, originated from the dissolution of the anode during the electrodeposition. A recent work published elsewhere has reported a study on the morphology and spatial distribution of the U/Pt deposits with the related chemical speciation of U, using scanning electron microscopy with energy dispersive X-Ray spectroscopy, X-Ray photoelectron spectroscopy and X-Ray absorption fine structure (XAFS). |
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