Characterization of electrical transitions using transmission line measurements
An analytical methodology for characterizing electrical transitions associated with transmission line-based microwave channels is presented in this paper. The methodology is formulated using ABCD matrixes obtained from S-parameters measured to two lines with different length and terminated with the...
| Autores: | , |
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| Tipo de recurso: | artículo |
| Estado: | Versión aceptada para publicación |
| Fecha de publicación: | 2009 |
| País: | México |
| Institución: | Instituto Nacional de Astrofísica, Óptica y Electrónica |
| Repositorio: | Repositorio Institucional del INAOE |
| Idioma: | inglés |
| OAI Identifier: | oai:inaoe.repositorioinstitucional.mx:1009/1284 |
| Acceso en línea: | http://inaoe.repositorioinstitucional.mx/jspui/handle/1009/1284 |
| Access Level: | acceso abierto |
| Palabra clave: | info:eu-repo/classification/ABCD matrix/ABCD matrix info:eu-repo/classification/Electrical transitions/Electrical transitions info:eu-repo/classification/Transmission lines/Transmission lines info:eu-repo/classification/cti/1 info:eu-repo/classification/cti/22 info:eu-repo/classification/cti/2203 |
| Sumario: | An analytical methodology for characterizing electrical transitions associated with transmission line-based microwave channels is presented in this paper. The methodology is formulated using ABCD matrixes obtained from S-parameters measured to two lines with different length and terminated with the transition under investigation. This allows to determine the two-port network parameters of the transition in a simple and direct way. Excellent results are obtained when characterizing coplanar waveguide-to-microstrip and coaxial-to-microstrip transitions. Moreover, the methodology was also successfully applied to obtain the network parameters of packages fabricated on printed circuit board technology. |
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