Near-field microscopy of evanescent microwaves
Local control of evanescent microwaves is experimentally investigated using a scanning near-field microwave microscope. The capabilitiesof the microscope and the contribution, on the near field images, of propagating field components stemming from inelastic (out-of-plane)scattering were elucidated....
| Autores: | , , , , |
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| Tipo de recurso: | artículo |
| Estado: | Versión publicada |
| Fecha de publicación: | 2005 |
| País: | México |
| Institución: | Universidad Autónoma de Nuevo León |
| Repositorio: | Redalyc-UANL |
| OAI Identifier: | oai:redalyc.org:57064013 |
| Acceso en línea: | https://www.redalyc.org/articulo.oa?id=57064013 https://www.redalyc.org/journal/570/57064013/ https://www.redalyc.org/journal/570/57064013/html/ https://www.redalyc.org/journal/570/57064013/57064013.epub https://www.redalyc.org/journal/570/57064013/movil |
| Access Level: | acceso abierto |
| Palabra clave: | Física, Astronomía y Matemáticas wave optics Scanning near microwave radiation field optical microscopy |
| Sumario: | Local control of evanescent microwaves is experimentally investigated using a scanning near-field microwave microscope. The capabilitiesof the microscope and the contribution, on the near field images, of propagating field components stemming from inelastic (out-of-plane)scattering were elucidated. A set of two-dimensional mirrors for a local control of evanescent modes are shown along with their correspondingnear-field image, and their efficiency is discussed. We believe that the experimental approach used is reliable enough to be used as a checkof potential (two-dimensional) micro-components and possibly for micro and nano-circuits. |
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