Applications of the atomic force microscopy to nuclear track methodology
The fundamental instrumentation scheme of atomic force microscopy is reviewed, with the purpose of understanding the great value of thistechnology in studying nuclear tracks in solids. Different morphologies are revealed in the samples, in which detailed metrological featuresare very important in th...
| Autores: | , , , |
|---|---|
| Tipo de recurso: | artículo |
| Estado: | Versión publicada |
| Fecha de publicación: | 2007 |
| País: | México |
| Institución: | Universidad Nacional Autónoma de México |
| Repositorio: | Redalyc-UNAM |
| OAI Identifier: | oai:redalyc.org:57066312 |
| Acceso en línea: | https://www.redalyc.org/articulo.oa?id=57066312 https://www.redalyc.org/journal/570/57066312/ https://www.redalyc.org/journal/570/57066312/html/ https://www.redalyc.org/journal/570/57066312/57066312.epub https://www.redalyc.org/journal/570/57066312/movil |
| Access Level: | acceso abierto |
| Palabra clave: | Física, Astronomía y Matemáticas plastic detectors Atomic force microscopy nuclear track detectors |
| Sumario: | The fundamental instrumentation scheme of atomic force microscopy is reviewed, with the purpose of understanding the great value of thistechnology in studying nuclear tracks in solids. Different morphologies are revealed in the samples, in which detailed metrological featuresare very important in the characterization and study of nuclear tracks. Among them, conical pits on etched CR-39 exposed to alpha particles,and hillocks and/or craters on some minerals exposed to 252Cf fission fragments. Some examples of artifacts in the convolution of sampletopography and probe geometry are also mentioned. |
|---|