Photoluminescence Emission and Structure Study in ZnO Nanorods
Scanning electronic miscroscopy (SEM), X ray diffraction (XRD) and photoluminescence (PL) have been applied to the study of structural and optical properties of ZnO nanocrystals prepared by the ultrasonic spray pyrolysis (USP) at different temperatures. The variation of temperatures and times at the...
| Autores: | , |
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| Tipo de recurso: | artículo |
| Estado: | Versión publicada |
| Fecha de publicación: | 2013 |
| País: | México |
| Institución: | Instituto Politécnico Nacional |
| Repositorio: | Redalyc-IPN |
| OAI Identifier: | oai:redalyc.org:61436207004 |
| Acceso en línea: | https://www.redalyc.org/articulo.oa?id=61436207004 |
| Access Level: | acceso abierto |
| Palabra clave: | Ingeniería ZnO:Ag Nanorods Nanocrystals |
| Sumario: | Scanning electronic miscroscopy (SEM), X ray diffraction (XRD) and photoluminescence (PL) have been applied to the study of structural and optical properties of ZnO nanocrystals prepared by the ultrasonic spray pyrolysis (USP) at different temperatures. The variation of temperatures and times at the growth of ZnO films permits modifying the ZnO phase from the amorphous to crystalline, to change the size of ZnO nanocrystals (NCs), as well as to vary their photoluminescence spectra. The study has revealed three types of PL bands in ZnO NCs: defect related emission, the near-band-edge (NBE) PL, related to the LO phonon replica of free exciton (FE) recombination, and its second-order diffraction peaks. The PL bands, related to the LO phonon replica of FE, and its second- order diffraction in the room temperature Pl spectrum testify on the high quality of ZnO films prepared by the USP technology. |
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