Z-scan and spatial self-phase modulation of a Gaussian beam in a thin nonlocal nonlinear media

Considering that the nonlinear photoinduced phase shift to a Gaussian beam in a thin sample of nonlocal nonlinear media can be modeled as a Gaussian function to some real power the far-field can be calculated using the Fraunhofer integral. In this paper we calculate numerically this integral to obta...

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Detalles Bibliográficos
Autores: SABINO CHAVEZ CERDA, Marcelo David Iturbe Castillo
Tipo de recurso: artículo
Estado:Versión aceptada para publicación
Fecha de publicación:2011
País:México
Institución:Instituto Nacional de Astrofísica, Óptica y Electrónica
Repositorio:Repositorio Institucional del INAOE
Idioma:inglés
OAI Identifier:oai:inaoe.repositorioinstitucional.mx:1009/1628
Acceso en línea:http://inaoe.repositorioinstitucional.mx/jspui/handle/1009/1628
Access Level:acceso abierto
Palabra clave:info:eu-repo/classification/Inspec/Nonlinear phase shift
info:eu-repo/classification/Inspec/Nonlocal nonlinear media
info:eu-repo/classification/Inspec/Z-scan
info:eu-repo/classification/Inspec/Self-phase modulation
info:eu-repo/classification/cti/1
info:eu-repo/classification/cti/22
info:eu-repo/classification/cti/2209
Descripción
Sumario:Considering that the nonlinear photoinduced phase shift to a Gaussian beam in a thin sample of nonlocal nonlinear media can be modeled as a Gaussian function to some real power the far-field can be calculated using the Fraunhofer integral. In this paper we calculate numerically this integral to obtain the on-axis intensity in a Z-scan experiment or the intensity pattern in a self-phase modulation experiment. Experimental results of samples under cw illumination are fitted using the model with a good correspondence between experimental and numerical results. The model presented is adequate to describe samples with any magnitude of the máximum nonlinear photoinduced phase shift of purely refractive local or nonlocal nonlinear thin media.