X-ray production induced by heavy ion impact: challenges and possible uses

The emission of X-rays after the excitation with photons, electrons, or light ions (such as protons or deuterons), has been extensively studied.However, when heavier ions are used as primary radiation to induce this effect, other phenomena appear that are not present in the othercases. They include,...

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Detalles Bibliográficos
Autores: M.F. Lugo-Licona, J. Miranda, O. G. de Lucio
Tipo de recurso: artículo
Estado:Versión publicada
Fecha de publicación:2007
País:México
Institución:Universidad Nacional Autónoma de México
Repositorio:Redalyc-UNAM
OAI Identifier:oai:redalyc.org:57066307
Acceso en línea:https://www.redalyc.org/articulo.oa?id=57066307
https://www.redalyc.org/journal/570/57066307/
https://www.redalyc.org/journal/570/57066307/html/
https://www.redalyc.org/journal/570/57066307/57066307.epub
https://www.redalyc.org/journal/570/57066307/movil
Access Level:acceso abierto
Palabra clave:Física, Astronomía y Matemáticas
rays
PIXE
ionization
heavy ion impact
Descripción
Sumario:The emission of X-rays after the excitation with photons, electrons, or light ions (such as protons or deuterons), has been extensively studied.However, when heavier ions are used as primary radiation to induce this effect, other phenomena appear that are not present in the othercases. They include, for example, the formation of short-lived molecules, the capture of electrons from the target atom by the incoming ion,and a strong increase in the multiple ionization of the target atom. Usually, the ionization cross sections are higher as compared to those ofphotons, electrons, or protons. Furthermore, when thick targets are irradiated with heavy ions, there is a larger probability to create defects inthe material, and also a higher stopping power in the target material. All these differences make the study of the X-ray production by heavyions a problem not fully understood, and far from being applied in an extensive manner to the characterization of materials. In this work, anexplanation of the basic phenomena is presented, together with possible uses of the emission of X-rays by the impact of the heavy ions, asan extension of the traditional method Particle Induced X-ray Emission (PIXE).