Genome-wide association study for spot blotch resistance in synthetic hexaploid wheat

Spot blotch (SB) caused by Bipolaris sorokiniana (Sacc.) Shoem is a destructive fungal disease affecting wheat and many other crops. Synthetic hexaploid wheat (SHW) offers opportunities to explore new resistance genes for SB for introgression into elite bread wheat. The objectives of our study were...

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Detalles Bibliográficos
Autores: Lozano, N., Dreisigacker, S., Sansaloni, C., Xinyao He, Sandoval Islas, J.S., Pérez-Rodríguez, P., Carballo-Carballo, A., Nava Diaz, C., Kishii, M., Singh, P.K.
Tipo de recurso: artículo
Estado:Versión publicada
Fecha de publicación:2022
País:México
Institución:Centro Internacional de Mejoramiento de Maíz y Trigo
Repositorio:Repositorio Institucional de Publicaciones Multimedia del CIMMYT
OAI Identifier:oai:repository.cimmyt.org:10883/22198
Acceso en línea:https://hdl.handle.net/10883/22198
Access Level:acceso abierto
Palabra clave:AGRICULTURAL SCIENCES AND BIOTECHNOLOGY
Spot Blotch
Genome-Wide Association Study
Synthetic Hexaploid Wheat
Partial Least Squares Regression
FOLIAR DISEASES
BIPOLARIS SOROKINIANA
FUNGAL DISEASES
DISEASE RESISTANCE
WHEAT
Descripción
Sumario:Spot blotch (SB) caused by Bipolaris sorokiniana (Sacc.) Shoem is a destructive fungal disease affecting wheat and many other crops. Synthetic hexaploid wheat (SHW) offers opportunities to explore new resistance genes for SB for introgression into elite bread wheat. The objectives of our study were to evaluate a collection of 441 SHWs for resistance to SB and to identify potential new genomic regions associated with the disease. The panel exhibited high SB resistance, with 250 accessions showing resistance and 161 showing moderate resistance reactions. A genome-wide association study (GWAS) revealed a total of 41 significant marker-trait associations for resistance to SB, being located on chromosomes 1B, 1D, 2A, 2B, 2D, 3A, 3B, 3D, 4A, 4D, 5A, 5D, 6D, 7A, and 7D; yet none of them exhibited a major phenotypic effect. In addition, a partial least squares regression was conducted to validate the marker-trait associations, and 15 markers were found to be most important for SB resistance in the panel. To our knowledge, this is the first GWAS to investigate SB resistance in SHW that identified markers and resistant SHW lines to be utilized in wheat breeding.