Synthesis of self-assembled Ge nanocrystals employing reactive RF sputtering

This work presents the results of a simple methodology able to control crystal size, dispersion and spatial distribution of germanium nanocrys- tals (Ge-NCs). It takes advantage of a self-assembled process taken place during the deposit of the system SiO 2 /Ge/SiO 2 by reactive RF sputtering. Nanopa...

Descripción completa

Detalles Bibliográficos
Autores: A. Hernández-Hernández, L.A. Hernández-Hernández, B. Marel Monroy, J. Santoyo-Salazar, G. Santana-Rodríguez, A. Márquez-Herrera, S. Gallardo-Hernández, P.G. Mani-González, M. Meléndez-Lira
Tipo de recurso: artículo
Estado:Versión publicada
Fecha de publicación:2016
País:México
Institución:Universidad Nacional Autónoma de México
Repositorio:Redalyc-UNAM
OAI Identifier:oai:redalyc.org:57048164010
Acceso en línea:https://www.redalyc.org/articulo.oa?id=57048164010
Access Level:acceso abierto
Palabra clave:Física, Astronomía y Matemáticas
germanium
Nanocrystals
heteroestructure
reactive RF sputtering
Descripción
Sumario:This work presents the results of a simple methodology able to control crystal size, dispersion and spatial distribution of germanium nanocrys- tals (Ge-NCs). It takes advantage of a self-assembled process taken place during the deposit of the system SiO 2 /Ge/SiO 2 by reactive RF sputtering. Nanoparticles formation is controlled mainly by the roughness of the first SiO 2 layer but the ulterior interaction of the interlayer with the top layer also play a role. Structural quality of germanium nanocrystals increases with roughness and the interlayer thickness. The tetragonal phase of germanium is produced and its crystallographic quality improves with interlayer thickness and oxygen partial pressure. Room temperature photoluminescence emission without a post growth thermal annealing process indicates that our methodology produces a low density of non-radiative traps.