Experimental Synchronization of two Integrated Multi-scroll Chaotic Oscillators

Chaotic oscillators have been implemented with a wide variety of discrete electronic devices and quite fewrealizations using integrated circuit technology. This article describes the synchronization of two chaotic oscillatorsalready fabricated with complementary metal-oxide-semiconductor (CMOS) inte...

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Detalles Bibliográficos
Autores: Muñoz-Pacheco, J.M., Tlelo-Cuautle, E., Flores-Tiro, I. E., Trejo-Guerra, R.
Tipo de recurso: artículo
Estado:Versión publicada
Fecha de publicación:2014
País:México
Institución:UNIVERSIDAD NACIONAL AUTÓNOMA DE MÉXICO
Repositorio:Journal of Applied Research and Technology
Idioma:inglés
OAI Identifier:oai:ojs2.localhost:article/207
Acceso en línea:https://jart.icat.unam.mx/index.php/jart/article/view/207
Access Level:acceso abierto
Palabra clave:Chaos
Synchronization
Integrated Circuit
CMOS
Multi-scroll
Descripción
Sumario:Chaotic oscillators have been implemented with a wide variety of discrete electronic devices and quite fewrealizations using integrated circuit technology. This article describes the synchronization of two chaotic oscillatorsalready fabricated with complementary metal-oxide-semiconductor (CMOS) integrated circuit technology of 0.5umand generating 3- and 5-scrolls. In order to attain the synchronization, we use a master-slave topology withunidirectional coupling. Within this context, a system parameter iterates until the correlation coefficient computedbetween the chaotic signals generated by the master and slave systems approximates to unity. For the followingparameter, its value depends on the standard deviations from the individual signals contrary to previous one. Bycombining those statistical relationships according to the number of system parameters, we can synchronizeintegrated chaotic oscillators. Theoretical model simulations of two chaotic oscillators generating 3- and 5-scrolls,and experimental results for two integrated 3-scroll chaotic oscillators validate this approach. Stability and erroranalysis are also included.