A reliability analysis for electronic devices under an extension of exponentiated perks distribution
This paper presents a reliability analysis for electronic devices (ED) with bathtub curve-shaped failure times. An extension of the exponentiated perks distribution (EPD) is proposed for the analysis. The extension of this new distribution is based on the Alpha Power Transformation, so the Alpha Exp...
| Autores: | , , , , |
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| Tipo de recurso: | artículo |
| Estado: | Versión publicada |
| Fecha de publicación: | 2022 |
| País: | México |
| Institución: | Universidad Autónoma de Ciudad Juárez |
| Repositorio: | Repositorio Institucional de la Universidad Autónoma de Ciudad Juárez |
| OAI Identifier: | oai:uacj.mx:oai:cathi.uacj.mx:20.500.11961ir-24367 |
| Acceso en línea: | https://doi.org/10.1002/qre.3255 |
| Access Level: | acceso abierto |
| Palabra clave: | alpha exponentiated perks distribution, bathtub shape distribution, non-monotone failure rate, perks distribution, reliability of electronic devices info:eu-repo/classification/cti/7 |
| Sumario: | This paper presents a reliability analysis for electronic devices (ED) with bathtub curve-shaped failure times. An extension of the exponentiated perks distribution (EPD) is proposed for the analysis. The extension of this new distribution is based on the Alpha Power Transformation, so the Alpha Exponentiated Perks Distribution (AEXP) is introduced. The AEXP has three shape parameters and one scale parameter, allowing greater flexibility to represent failure rates in an increasing, decreasing, or bathtub curve form. Some useful properties in the reliability engineering context are presented. AEXP parameters were estimated via the Maximum Likelihood Method. Finally, two case studies focused on ED are used to compare the proposed distribution and other distributions with similar failure rate representation properties. The obtained results show that the AEXP better describes the behavior of ED than the distributions considered in the analysis. |
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