Mechanical-alloying and lattice distortions in ball-milled CuFe
A least-square fitting analysis of EXAFS data collected from partially-crystallized Fe_80B_20 thin films (t=15 nm), using data collected from pure phase standards of the crystallization products, was found effective in determining the relative atomic fraction of each crystalline phase present. This...
| Autores: | , , , , , |
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| Tipo de recurso: | artículo |
| Fecha de publicación: | 1997 |
| País: | España |
| Institución: | Universidad Complutense de Madrid (UCM) |
| Repositorio: | Docta Complutense |
| Idioma: | inglés |
| OAI Identifier: | oai:docta.ucm.es:20.500.14352/60117 |
| Acceso en línea: | https://hdl.handle.net/20.500.14352/60117 |
| Access Level: | acceso abierto |
| Palabra clave: | 538.9 Absorption fine-structure Fcc Fe-Cu Magnetic-properties Física de materiales Física del estado sólido 2211 Física del Estado Sólido |
| Sumario: | A least-square fitting analysis of EXAFS data collected from partially-crystallized Fe_80B_20 thin films (t=15 nm), using data collected from pure phase standards of the crystallization products, was found effective in determining the relative atomic fraction of each crystalline phase present. This fitting scheme provides a means for the quantitative treatment of crystallization and precipitation kinetics in thin films and multilayered structures. |
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