Structural, vibrational and electrical study of compressed BiTeBr

Compresed BiTeBr has been studied from a joint experimental and theoretical perspective. Room-temperature x-ray diffraction, Raman scattering, and transport measurements at high pressures have been performed in this layered semiconductor and interpreted with the help of ab initio calculations. A rev...

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Detalles Bibliográficos
Autores: Sans-Tresserras, Juan Ángel, Pereira, A.L.J., Gomis, O., SEGURA, A., Muñoz, A., Rodríguez-Hernández, Plácida, Catalin Popescu, Drasar, C., Ruleova, P., Manjón, Francisco-Javier|||0000-0002-3926-1705, Vilaplana Cerda, Rosario Isabel|||0000-0003-0504-2157
Tipo de recurso: artículo
Fecha de publicación:2016
País:España
Institución:Universitat Politècnica de València (UPV)
Repositorio:RiuNet. Repositorio Institucional de la Universitat Politécnica de Valéncia
Idioma:inglés
OAI Identifier:oai:riunet.upv.es:10251/79519
Acceso en línea:https://riunet.upv.es/handle/10251/79519
Access Level:acceso abierto
Palabra clave:FISICA APLICADA
Descripción
Sumario:Compresed BiTeBr has been studied from a joint experimental and theoretical perspective. Room-temperature x-ray diffraction, Raman scattering, and transport measurements at high pressures have been performed in this layered semiconductor and interpreted with the help of ab initio calculations. A reversible first-order phase transition has been observed above 6–7 GPa, but changes in structural, vibrational, and electrical properties have also been noted near 2 GPa. Structural and vibrational changes are likely due to the hardening of interlayer forces rather than to a second-order isostructural phase transition while electrical changes are mainly attributed to changes in the electron mobility. The possibility of a pressure-induced electronic topological transition and of a pressure-induced quantum topological phase transition in BiTeBr and other bismuth tellurohalides, like BiTeI, is also discussed.