Techniques to Deal with Off-Diagonal Elements in Confusion Matrices

Confusion matrices are numerical structures that deal with the distribution of errors between different classes or categories in a classification process. From a quality perspective, it is of interest to know if the confusion between the true class A and the class labelled as B is not the same as th...

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Detalles Bibliográficos
Autores: Barranco Chamorro, Inmaculada, Carrillo García, Rosa María
Tipo de recurso: artículo
Estado:Versión publicada
Fecha de publicación:2021
País:España
Institución:Universidad de Sevilla (US)
Repositorio:idUS. Depósito de Investigación de la Universidad de Sevilla
OAI Identifier:oai:idus.us.es:11441/134917
Acceso en línea:https://hdl.handle.net/11441/134917
https://doi.org/10.3390/math9243233
Access Level:acceso abierto
Palabra clave:Bias of classification
Confusion matrix
Marginal homogeneity tests
Dirichlet distribution
Misclassification
Posterior density
Overprediction
Underprediction
Descripción
Sumario:Confusion matrices are numerical structures that deal with the distribution of errors between different classes or categories in a classification process. From a quality perspective, it is of interest to know if the confusion between the true class A and the class labelled as B is not the same as the confusion between the true class B and the class labelled as A. Otherwise, a problem with the classifier, or of identifiability between classes, may exist. In this paper two statistical methods are considered to deal with this issue. Both of them focus on the study of the off-diagonal cells in confusion matrices. First, McNemar-type tests to test the marginal homogeneity are considered, which must be followed from a one versus all study for every pair of categories. Second, a Bayesian proposal based on the Dirichlet distribution is introduced. This allows us to assess the probabilities of misclassification in a confusion matrix. Three applications, including a set of omic data, have been carried out by using the software R.