Towards population inversion of electrically pumped Er ions sensitized by Si nanoclusters

This study reports the estimation of the inverted Er fraction in a system of Er doped silicon oxide sensitized by Si nanoclusters, made by magnetron sputtering. Electroluminescence was obtained from the sensitized erbium, with a power efficiency of 10¿2 %. By estimating the density of Er ions that a...

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Detalles Bibliográficos
Autores: Jambois, Olivier, Gourbilleau, Fabrice, Kenyon, Anthony J., Montserrat i Martí, Josep, Rizk, Richard, Garrido Fernández, Blas
Tipo de recurso: artículo
Estado:Versión publicada
Fecha de publicación:2010
País:España
Institución:Varias* (Consorci de Biblioteques Universitáries de Catalunya, Centre de Serveis Científics i Acadèmics de Catalunya)
Repositorio:Recercat. Dipósit de la Recerca de Catalunya
OAI Identifier:oai:recercat.cat:2445/15726
Acceso en línea:https://hdl.handle.net/2445/15726
Access Level:acceso abierto
Palabra clave:Terres rares
Semiconductors
Propietats òptiques
Amplificadors (Electrònica)
Optical properties
Amplifiers (Electronics)
Descripción
Sumario:This study reports the estimation of the inverted Er fraction in a system of Er doped silicon oxide sensitized by Si nanoclusters, made by magnetron sputtering. Electroluminescence was obtained from the sensitized erbium, with a power efficiency of 10¿2 %. By estimating the density of Er ions that are in the first excited state, we find that up to 20% of the total Er concentration is inverted in the best device, which is one order of magnitude higher than that achieved by optical pumping of similar materials.