Geometrical Phase Optical Components: Measuring Geometric Phase without Interferometry

Optical components that are based on Pancharatnam-Berry phase feature a polarization-dependent diffraction that can be used to fabricate lenses and gratings with unique properties. In recent years, the great progress made in the fabrication of the metasurfaces that are required for these optical com...

Descripción completa

Detalles Bibliográficos
Autores: Arteaga Barriel, Oriol, Bendada, Hana
Tipo de recurso: artículo
Estado:Versión publicada
Fecha de publicación:2020
País:España
Institución:Universidad de Barcelona
Repositorio:Dipòsit Digital de la UB
OAI Identifier:oai:diposit.ub.edu:2445/176213
Acceso en línea:https://hdl.handle.net/2445/176213
Access Level:acceso abierto
Palabra clave:El·lipsometria
Polarització (Llum)
Ellipsometry
Polarization (Light)
id ES_f0d7f340fdbb9732e5576ab3e9537430
oai_identifier_str oai:diposit.ub.edu:2445/176213
network_acronym_str ES
network_name_str España
repository_id_str
spelling Geometrical Phase Optical Components: Measuring Geometric Phase without InterferometryArteaga Barriel, OriolBendada, HanaEl·lipsometriaPolarització (Llum)EllipsometryPolarization (Light)Optical components that are based on Pancharatnam-Berry phase feature a polarization-dependent diffraction that can be used to fabricate lenses and gratings with unique properties. In recent years, the great progress made in the fabrication of the metasurfaces that are required for these optical components has lowered their cost and has made them widely available. One of the often-overlooked properties of optical components based on geometrical phases (GPs) is that, contrary to dynamical phases, their phase can be measured while using a polarimetric technique without the need to resort to interferometry methods. This is possible because the Pancharatnam-Berry phase is not controlled by an optical path difference; it results from a space variant polarization manipulation. In this work, we apply Mueller matrix microscopy in order to measure the geometrical phase of GP lenses and polarization gratings. We show that a single space resolved Mueller matrix measurement with micrometric resolution is enough to obtain a full characterization phase-profile of these GP-based optical components and evaluate their performance.MDPI2020info:eu-repo/semantics/articleinfo:eu-repo/semantics/publishedVersionapplication/pdfhttps://hdl.handle.net/2445/176213Articles publicats en revistes (Física Aplicada)reponame:Dipòsit Digital de la UBinstname:Universidad de BarcelonaInglésReproducció del document publicat a: https://doi.org/10.3390/cryst10100880Crystals, 2020, vol. 10, num. 10, p. 880https://doi.org/10.3390/cryst10100880cc-by (c) Arteaga Barriel, Oriol et al., 2020http://creativecommons.org/licenses/by/3.0/esinfo:eu-repo/semantics/openAccessoai:diposit.ub.edu:2445/1762132026-05-27T06:46:51Z
dc.title.none.fl_str_mv Geometrical Phase Optical Components: Measuring Geometric Phase without Interferometry
title Geometrical Phase Optical Components: Measuring Geometric Phase without Interferometry
spellingShingle Geometrical Phase Optical Components: Measuring Geometric Phase without Interferometry
Arteaga Barriel, Oriol
El·lipsometria
Polarització (Llum)
Ellipsometry
Polarization (Light)
title_short Geometrical Phase Optical Components: Measuring Geometric Phase without Interferometry
title_full Geometrical Phase Optical Components: Measuring Geometric Phase without Interferometry
title_fullStr Geometrical Phase Optical Components: Measuring Geometric Phase without Interferometry
title_full_unstemmed Geometrical Phase Optical Components: Measuring Geometric Phase without Interferometry
title_sort Geometrical Phase Optical Components: Measuring Geometric Phase without Interferometry
dc.creator.none.fl_str_mv Arteaga Barriel, Oriol
Bendada, Hana
author Arteaga Barriel, Oriol
author_facet Arteaga Barriel, Oriol
Bendada, Hana
author_role author
author2 Bendada, Hana
author2_role author
dc.subject.none.fl_str_mv El·lipsometria
Polarització (Llum)
Ellipsometry
Polarization (Light)
topic El·lipsometria
Polarització (Llum)
Ellipsometry
Polarization (Light)
description Optical components that are based on Pancharatnam-Berry phase feature a polarization-dependent diffraction that can be used to fabricate lenses and gratings with unique properties. In recent years, the great progress made in the fabrication of the metasurfaces that are required for these optical components has lowered their cost and has made them widely available. One of the often-overlooked properties of optical components based on geometrical phases (GPs) is that, contrary to dynamical phases, their phase can be measured while using a polarimetric technique without the need to resort to interferometry methods. This is possible because the Pancharatnam-Berry phase is not controlled by an optical path difference; it results from a space variant polarization manipulation. In this work, we apply Mueller matrix microscopy in order to measure the geometrical phase of GP lenses and polarization gratings. We show that a single space resolved Mueller matrix measurement with micrometric resolution is enough to obtain a full characterization phase-profile of these GP-based optical components and evaluate their performance.
publishDate 2020
dc.date.none.fl_str_mv 2020
dc.type.none.fl_str_mv info:eu-repo/semantics/article
info:eu-repo/semantics/publishedVersion
format article
status_str publishedVersion
dc.identifier.none.fl_str_mv https://hdl.handle.net/2445/176213
url https://hdl.handle.net/2445/176213
dc.language.none.fl_str_mv Inglés
language_invalid_str_mv Inglés
dc.relation.none.fl_str_mv Reproducció del document publicat a: https://doi.org/10.3390/cryst10100880
Crystals, 2020, vol. 10, num. 10, p. 880
https://doi.org/10.3390/cryst10100880
dc.rights.none.fl_str_mv cc-by (c) Arteaga Barriel, Oriol et al., 2020
http://creativecommons.org/licenses/by/3.0/es
info:eu-repo/semantics/openAccess
rights_invalid_str_mv cc-by (c) Arteaga Barriel, Oriol et al., 2020
http://creativecommons.org/licenses/by/3.0/es
eu_rights_str_mv openAccess
dc.format.none.fl_str_mv application/pdf
dc.publisher.none.fl_str_mv MDPI
publisher.none.fl_str_mv MDPI
dc.source.none.fl_str_mv Articles publicats en revistes (Física Aplicada)
reponame:Dipòsit Digital de la UB
instname:Universidad de Barcelona
instname_str Universidad de Barcelona
reponame_str Dipòsit Digital de la UB
collection Dipòsit Digital de la UB
repository.name.fl_str_mv
repository.mail.fl_str_mv
_version_ 1869424045832798208
score 15.300719

Similares en LA Referencia