Nanostructured PbS-doped inorganic film synthesized by sol-gel route

IV-VI semiconductor quantum dots embedded into an inorganic matrix represent nanostructured composite materials with potential application in temperature sensor systems. This study explores the optical, structural, and morphological properties of a novel PbS quantum dots (QDs)- doped inorganic thin...

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Detalles Bibliográficos
Autores: Nicoara, Adrian Ionut, Eftimie, Mihai, Mihail, Elisa, Vasiliu, Ileana Cristina, Bartha, Cristina, Enculescu, Monica, Filipescu, Mihaela, Elosúa Aguado, César, López Torres, Diego, Sava, Bogdan Alexandru, Oane, Mihai
Tipo de recurso: artículo
Estado:Versión publicada
Fecha de publicación:2022
País:España
Institución:Universidad Pública de Navarra
Repositorio:Academica-e. Repositorio Institucional de la Universidad Pública de Navarra
OAI Identifier:oai:academica-e.unavarra.es:2454/44489
Acceso en línea:https://hdl.handle.net/2454/44489
Access Level:acceso abierto
Palabra clave:Alumino-silico-phosphate glass
Composite material
Lead sulfide
Optical properties
Quantum confinement
Quantum dots
Sol-gel method
Descripción
Sumario:IV-VI semiconductor quantum dots embedded into an inorganic matrix represent nanostructured composite materials with potential application in temperature sensor systems. This study explores the optical, structural, and morphological properties of a novel PbS quantum dots (QDs)- doped inorganic thin film belonging to the Al2O3 -SiO2 -P2O5 system. The film was synthesized by the sol-gel method, spin coating technique, starting from a precursor solution deposited on a glass substrate in a multilayer process, followed by drying of each deposited layer. Crystalline PbS QDs embedded in the inorganic vitreous host matrix formed a nanocomposite material. Specific investigations such as X-ray diffraction (XRD), optical absorbance in the ultraviolet (UV)-visible (Vis)-near infrared (NIR) domain, NIR luminescence, Raman spectroscopy, scanning electron microscopy– energy dispersive X-ray (SEM-EDX), and atomic force microscopy (AFM) were used to obtain a comprehensive characterization of the deposited film. The dimensions of the PbS nanocrystallite phase were corroborated by XRD, SEM-EDX, and AFM results. The luminescence band from 1400 nm follows the luminescence peak of the precursor solution and that of the dopant solution. The emission of the PbS-doped film in the NIR domain is a premise for potential application in temperature sensing systems.