Cita APA

Rodríguez Montañés, R., Arumi Delgado, D., Figueras Pàmies, J., Eichenberger, S., Hora, C., & Kruseman, B. (2007). Impact of gate tunnelling leakage on CMOS circuits with full open defects.

Citación estilo Chicago

Rodríguez Montañés, Rosa|||0000-0001-6231-0862, Daniel|||0000-0002-6638-7485 Arumi Delgado, Joan Figueras Pàmies, S. Eichenberger, Camelia Hora, y B. Kruseman. Impact of Gate Tunnelling Leakage On CMOS Circuits With Full Open Defects. 2007.

Cita MLA

Rodríguez Montañés, Rosa|||0000-0001-6231-0862, et al. Impact of Gate Tunnelling Leakage On CMOS Circuits With Full Open Defects. 2007.