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Cita APA

Frutos, E., Serra, R., & Jiménez, J. A. (2021). Evaluation of bias voltage-dependent mechanical properties of amorphous TiSi2 thin films on PEEK by nano-characterization techniques.

Citación estilo Chicago

Frutos, E., R. Serra, y José Antonio Jiménez. Evaluation of Bias Voltage-dependent Mechanical Properties of Amorphous TiSi2 Thin Films On PEEK By Nano-characterization Techniques. 2021.

Cita MLA

Frutos, E., R. Serra, y José Antonio Jiménez. Evaluation of Bias Voltage-dependent Mechanical Properties of Amorphous TiSi2 Thin Films On PEEK By Nano-characterization Techniques. 2021.

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