Absence of magnetic proximity effect at the interface of Bi2Se3 and (Bi,Sb)2Te3 with EuS
We performed X-ray magnetic circular dichroism (XMCD) measurements on heterostructures comprising topological insulators (TIs) of the (Bi,Sb)2(Se,Te)3 family and the magnetic insulator EuS. XMCD measurements allow us to investigate element-selective magnetic proximity effects at the very TI/EuS inte...
| Autores: | , , , , , , , |
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| Tipo de recurso: | artículo |
| Fecha de publicación: | 2020 |
| País: | España |
| Institución: | Universitat Autònoma de Barcelona |
| Repositorio: | Dipòsit Digital de Documents de la UAB |
| Idioma: | inglés |
| OAI Identifier: | oai:ddd.uab.cat:251004 |
| Acceso en línea: | https://ddd.uab.cat/record/251004 https://dx.doi.org/urn:doi:10.1103/PhysRevLett.125.226801 |
| Access Level: | acceso abierto |
| Palabra clave: | Detection limits Induced magnetic moments Induced magnetism Magnetic insulator Magnetic proximity Measurements of Systematic analysis X-ray magnetic circular dichroism |
| Sumario: | We performed X-ray magnetic circular dichroism (XMCD) measurements on heterostructures comprising topological insulators (TIs) of the (Bi,Sb)2(Se,Te)3 family and the magnetic insulator EuS. XMCD measurements allow us to investigate element-selective magnetic proximity effects at the very TI/EuS interface. A systematic analysis reveals that there is neither significant induced magnetism within the TI nor an enhancement of the Eu magnetic moment at such interface. The induced magnetic moments in Bi, Sb, Te, and Se sites are lower than the estimated detection limit of the XMCD measurements of ∼10-3 μB/at. |
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