A General approach for the calculation of intermodulation distortion in cavities with superconducting endplates
We report on a general procedure to calculate intermodulation distortion in cavities with superconducting endplates that is applicable to the dielectric-loaded cavities currently used for measurement of surface resistance in high-temperature superconductors. The procedure would enable the use such c...
| Autores: | , , , |
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| Tipo de recurso: | artículo |
| Fecha de publicación: | 2003 |
| País: | España |
| Institución: | Universitat Politècnica de Catalunya (UPC) |
| Repositorio: | UPCommons. Portal del coneixement obert de la UPC |
| Idioma: | inglés |
| OAI Identifier: | oai:upcommons.upc.edu:2117/86367 |
| Acceso en línea: | https://hdl.handle.net/2117/86367 |
| Access Level: | acceso abierto |
| Palabra clave: | Microwaves Microones Àrees temàtiques de la UPC::Enginyeria de la telecomunicació |
| Sumario: | We report on a general procedure to calculate intermodulation distortion in cavities with superconducting endplates that is applicable to the dielectric-loaded cavities currently used for measurement of surface resistance in high-temperature superconductors. The procedure would enable the use such cavities for intermodulation characterization of unpatterned superconducting films, and would remove the uncertainty of measuring intermodulation on patterned devices, in which the effect of patterning damage might influence the outcome of the measurements. We have verified the calculation method by combining superconducting and copper endplates in a rutile-loaded cavity |
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