Analysis of the effects of natural radiation on Commercial-Off-The-Shelf (COTS) memories
In New Space, the need for reduced cost, higher performance, and more prompt delivery plans in radiation-harsh environments have motivated spacecraft designers to use Commercial-Off-The-Shelf (COTS) devices. This Ph.D. thesis investigates the behavior of state-of-the-art mamories and FPGA manufactur...
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| Tipo de recurso: | tesis doctoral |
| Fecha de publicación: | 2024 |
| País: | España |
| Institución: | Universidad Complutense de Madrid (UCM) |
| Repositorio: | Docta Complutense |
| Idioma: | inglés |
| OAI Identifier: | oai:docta.ucm.es:20.500.14352/102804 |
| Acceso en línea: | https://hdl.handle.net/20.500.14352/102804 |
| Access Level: | acceso abierto |
| Palabra clave: | 004.25 (043.2) Memorias (Ordenadores) Computer storage devices Informática (Informática) 1203.17 Informática |
| Sumario: | In New Space, the need for reduced cost, higher performance, and more prompt delivery plans in radiation-harsh environments have motivated spacecraft designers to use Commercial-Off-The-Shelf (COTS) devices. This Ph.D. thesis investigates the behavior of state-of-the-art mamories and FPGA manufactured in emerging technologies, including nv-SRAM, Ferroelectric Random-Access Memory (FRAM), Resistive Random-Access Memory (ReRAM)), Magnetic Random-Access Memory (MRAM), and a 28-nm bulk Xilinx Artix-7 FPGA against radiation effects. Radiation-ground test were conductted under 15-MeV and 1-MeV protons, thermal, and 14.8/14.2-MeV neutrons, leading to various categories of radiation effects. Experimental results will be presented and discussed with the CY14V101QS and CY15B101J nv-SRAMs, the CY15B102Q and CY15B104Q FRAMs (manufactured by Infineon Technologies), the MB85AS4MT and MB85AS8MT ReRAMs (manufactured by Fujitsu), and the MR10Q010CSC and MR25H40CDF MRAMs (manufactured by Everspin), and the Artix-7 XC7A100T Xilinx FPGA... |
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