Domain-wall structure in thin films with perpendicular anisotropy: Magnetic force microscopy and polarized neutron reflectometry study
Ferromagnetic domain patterns and three-dimensional domain-wall configurations in thin CoCrPt films with perpendicular magnetic anisotropy were studied in detail by combining magnetic force microscopy and polarized neutron reflectometry with micromagnetic simulations. With the first method, lateral...
| Autores: | , , , , , , , , |
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| Tipo de recurso: | artículo |
| Estado: | Versión aceptada para publicación |
| Fecha de publicación: | 2014 |
| País: | España |
| Institución: | Consejo Superior de Investigaciones Científicas (CSIC) |
| Repositorio: | DIGITAL.CSIC. Repositorio Institucional del CSIC |
| OAI Identifier: | oai:digital.csic.es:10261/181143 |
| Acceso en línea: | http://hdl.handle.net/10261/181143 |
| Access Level: | acceso abierto |
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Domain-wall structure in thin films with perpendicular anisotropy: Magnetic force microscopy and polarized neutron reflectometry studyNavas, DavidRedondo, CarolinaBadini-Confalonieri, G. A.Batallán, Francisco J.Devishvili, AntónIglesias-Freire, ÓscarAsenjo Barahona, AgustinaRoss, Caroline A.Toperverg, Boris P.Ferromagnetic domain patterns and three-dimensional domain-wall configurations in thin CoCrPt films with perpendicular magnetic anisotropy were studied in detail by combining magnetic force microscopy and polarized neutron reflectometry with micromagnetic simulations. With the first method, lateral dimension of domains with alternative magnetization directions normal to the surface and separated by domain walls in 20-nm-thick CoCrPt films were determined in good agreement with micromagnetic simulations. Quantitative analysis of data on reflectometry shows that domain walls consist of a Bloch wall in the center of the thin film, which is gradually transformed into a pair of Néel caps at the surfaces. The width and in-depth thickness of the Bloch wall element, transition region, and Néel caps are found consistent with micromagnetic calculations. A complex structure of domain walls serves to compromise a competition between exchange interactions, keeping spins parallel, magnetic anisotropy orienting magnetization normal to the surface, and demagnetizing fields, promoting in-plane magnetization. It is shown that the result of such competition strongly depends on the film thickness, and in the thinner CoCrPt film (10 nm thick), simple Bloch walls separate domains. Their lateral dimensions estimated from neutron scattering experiments agree with micromagnetic simulations.D.N. thanks the Ministerio de Economia y Competitividad (MAT2010-20798-C05-02) and Fundaçao para a Ciência e Tecnologia (Grant No. SFRH/BPD/89808/2012) for financial support and the Institut Laue-Langevin for providing beam time for the PNR experiment and technical support. C.A.R. acknowledges support of C-SPIN, one of six STARnet centers of Microelectronics Advanced Research Corporation (MARCO) and Defense Advanced Research Projects Agency (DARPA).Peer reviewedAmerican Physical SocietyMinisterio de Economía y Competitividad (España)Defense Advanced Research Projects Agency (US)Microelectronics Advanced Research CorporationConsejo Superior de Investigaciones Científicas [https://ror.org/02gfc7t72]2019201920142019info:eu-repo/semantics/articlehttp://purl.org/coar/resource_type/c_6501Postprintinfo:eu-repo/semantics/acceptedVersionhttp://hdl.handle.net/10261/181143reponame:DIGITAL.CSIC. Repositorio Institucional del CSICinstname:Consejo Superior de Investigaciones Científicas (CSIC)Ingléshttps://doi.org/10.1103/PhysRevB.90.054425Síinfo:eu-repo/semantics/openAccessoai:digital.csic.es:10261/1811432026-05-22T06:33:51Z |
| dc.title.none.fl_str_mv |
Domain-wall structure in thin films with perpendicular anisotropy: Magnetic force microscopy and polarized neutron reflectometry study |
| title |
Domain-wall structure in thin films with perpendicular anisotropy: Magnetic force microscopy and polarized neutron reflectometry study |
| spellingShingle |
Domain-wall structure in thin films with perpendicular anisotropy: Magnetic force microscopy and polarized neutron reflectometry study Navas, David |
| title_short |
Domain-wall structure in thin films with perpendicular anisotropy: Magnetic force microscopy and polarized neutron reflectometry study |
| title_full |
Domain-wall structure in thin films with perpendicular anisotropy: Magnetic force microscopy and polarized neutron reflectometry study |
| title_fullStr |
Domain-wall structure in thin films with perpendicular anisotropy: Magnetic force microscopy and polarized neutron reflectometry study |
| title_full_unstemmed |
Domain-wall structure in thin films with perpendicular anisotropy: Magnetic force microscopy and polarized neutron reflectometry study |
| title_sort |
Domain-wall structure in thin films with perpendicular anisotropy: Magnetic force microscopy and polarized neutron reflectometry study |
| dc.creator.none.fl_str_mv |
Navas, David Redondo, Carolina Badini-Confalonieri, G. A. Batallán, Francisco J. Devishvili, Antón Iglesias-Freire, Óscar Asenjo Barahona, Agustina Ross, Caroline A. Toperverg, Boris P. |
| author |
Navas, David |
| author_facet |
Navas, David Redondo, Carolina Badini-Confalonieri, G. A. Batallán, Francisco J. Devishvili, Antón Iglesias-Freire, Óscar Asenjo Barahona, Agustina Ross, Caroline A. Toperverg, Boris P. |
| author_role |
author |
| author2 |
Redondo, Carolina Badini-Confalonieri, G. A. Batallán, Francisco J. Devishvili, Antón Iglesias-Freire, Óscar Asenjo Barahona, Agustina Ross, Caroline A. Toperverg, Boris P. |
| author2_role |
author author author author author author author author |
| dc.contributor.none.fl_str_mv |
Ministerio de Economía y Competitividad (España) Defense Advanced Research Projects Agency (US) Microelectronics Advanced Research Corporation Consejo Superior de Investigaciones Científicas [https://ror.org/02gfc7t72] |
| description |
Ferromagnetic domain patterns and three-dimensional domain-wall configurations in thin CoCrPt films with perpendicular magnetic anisotropy were studied in detail by combining magnetic force microscopy and polarized neutron reflectometry with micromagnetic simulations. With the first method, lateral dimension of domains with alternative magnetization directions normal to the surface and separated by domain walls in 20-nm-thick CoCrPt films were determined in good agreement with micromagnetic simulations. Quantitative analysis of data on reflectometry shows that domain walls consist of a Bloch wall in the center of the thin film, which is gradually transformed into a pair of Néel caps at the surfaces. The width and in-depth thickness of the Bloch wall element, transition region, and Néel caps are found consistent with micromagnetic calculations. A complex structure of domain walls serves to compromise a competition between exchange interactions, keeping spins parallel, magnetic anisotropy orienting magnetization normal to the surface, and demagnetizing fields, promoting in-plane magnetization. It is shown that the result of such competition strongly depends on the film thickness, and in the thinner CoCrPt film (10 nm thick), simple Bloch walls separate domains. Their lateral dimensions estimated from neutron scattering experiments agree with micromagnetic simulations. |
| publishDate |
2014 |
| dc.date.none.fl_str_mv |
2014 2019 2019 2019 |
| dc.type.none.fl_str_mv |
info:eu-repo/semantics/article http://purl.org/coar/resource_type/c_6501 Postprint info:eu-repo/semantics/acceptedVersion |
| format |
article |
| status_str |
acceptedVersion |
| dc.identifier.none.fl_str_mv |
http://hdl.handle.net/10261/181143 |
| url |
http://hdl.handle.net/10261/181143 |
| dc.language.none.fl_str_mv |
Inglés |
| language_invalid_str_mv |
Inglés |
| dc.relation.none.fl_str_mv |
https://doi.org/10.1103/PhysRevB.90.054425 Sí |
| dc.rights.none.fl_str_mv |
info:eu-repo/semantics/openAccess |
| eu_rights_str_mv |
openAccess |
| dc.publisher.none.fl_str_mv |
American Physical Society |
| publisher.none.fl_str_mv |
American Physical Society |
| dc.source.none.fl_str_mv |
reponame:DIGITAL.CSIC. Repositorio Institucional del CSIC instname:Consejo Superior de Investigaciones Científicas (CSIC) |
| instname_str |
Consejo Superior de Investigaciones Científicas (CSIC) |
| reponame_str |
DIGITAL.CSIC. Repositorio Institucional del CSIC |
| collection |
DIGITAL.CSIC. Repositorio Institucional del CSIC |
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| repository.mail.fl_str_mv |
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1869423077661605888 |
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15.81155 |