Thin-film PV modules early degradation analysis: a case study on CIGS
[EN]Solar Photovoltaic (PV) energy generation will be one of the main energy generation technologies in the inner future thanks to the recent and significant reduction of involved costs. One of the most promising and lowest cost technologies is the thin-film PV modules technology. Their currently lo...
| Autores: | , , , , , , |
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| Tipo de recurso: | artículo |
| Estado: | Versión publicada |
| Fecha de publicación: | 2019 |
| País: | España |
| Institución: | Universidad de León |
| Repositorio: | BULERIA. Repositorio Institucional de la Universidad de León |
| OAI Identifier: | oai:buleria.unileon.es:10612/22784 |
| Acceso en línea: | https://hdl.handle.net/10612/22784 |
| Access Level: | acceso abierto |
| Palabra clave: | Energía Thin Film PV PV Degradation and Aging PV Faults CIGS 2106.01 Energía Solar 3322.02 Generación de Energía 3322.05 Fuentes no Convencionales de Energía |
| Sumario: | [EN]Solar Photovoltaic (PV) energy generation will be one of the main energy generation technologies in the inner future thanks to the recent and significant reduction of involved costs. One of the most promising and lowest cost technologies is the thin-film PV modules technology. Their currently lower performance than single-Si PV modules is compensated by their lower costs and more aesthetical display, which make them especially attractive for building integration. However, because of the novelty of this technology, very few studies have been conducted to analyse its aging and degradation, which has a significant impact on the operation and maintenance needs and, in the end, in its Levelized Cost of Energy (LCOE). Thus, in this work, a systematic review on this technology and on its more frequent faults and degradation effects is conducted first. Then, a set of Copper Indium Gallium Selenide (CIGS) PV modules has been tested under real outdoor conditions and its degradation has been analysed after 3 years operation. A new procedure for faults location and quantification has been established for this sort of PV modules; and early degradation and aging data are presented and analysed. Results show a significant early degradation of this technology and a fast expansion of the PV faults. |
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