Customized MFM probes with high lateral resolution

Magnetic force microscopy (MFM) is a widely used technique for magnetic imaging. Besides its advantages such as the high spatial resolution and the easy use in the characterization of relevant applied materials, the main handicaps of the technique are the lack of control over the tip stray field and...

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Detalles Bibliográficos
Autores: Iglesias-Freire, Óscar, Jaafar, Miriam, Berganza, Eider, Asenjo Barahona, Agustina
Tipo de recurso: artículo
Estado:Versión publicada
Fecha de publicación:2016
País:España
Institución:Consejo Superior de Investigaciones Científicas (CSIC)
Repositorio:DIGITAL.CSIC. Repositorio Institucional del CSIC
OAI Identifier:oai:digital.csic.es:10261/186078
Acceso en línea:http://hdl.handle.net/10261/186078
Access Level:acceso abierto
Palabra clave:Atomic force microscopy
Magnetic materials
Magnetic force microscopy (MFM)
High-resolution microscopy
AFM probes
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spelling Customized MFM probes with high lateral resolutionIglesias-Freire, ÓscarJaafar, MiriamBerganza, EiderAsenjo Barahona, AgustinaAtomic force microscopyMagnetic materialsMagnetic force microscopy (MFM)High-resolution microscopyAFM probesMagnetic force microscopy (MFM) is a widely used technique for magnetic imaging. Besides its advantages such as the high spatial resolution and the easy use in the characterization of relevant applied materials, the main handicaps of the technique are the lack of control over the tip stray field and poor lateral resolution when working under standard conditions. In this work, we present a convenient route to prepare high-performance MFM probes with sub-10 nm (sub-25 nm) topographic (magnetic) lateral resolution by following an easy and quick low-cost approach. This allows one to not only customize the tip stray field, avoiding tip-induced changes in the sample magnetization, but also to optimize MFM imaging in vacuum (or liquid media) by choosing tips mounted on hard (or soft) cantilevers, a technology that is currently not available on the market.This work was supported by grants CSD2010-00024 and MAT2013-48054-C2 from MINECO (Spain).Peer reviewedBeilstein InstitutMinisterio de Economía y Competitividad (España)Ministerio de Ciencia e Innovación (España)Consejo Superior de Investigaciones Científicas [https://ror.org/02gfc7t72]2019201920162019info:eu-repo/semantics/articlehttp://purl.org/coar/resource_type/c_6501Publisher's versioninfo:eu-repo/semantics/publishedVersionhttp://hdl.handle.net/10261/186078reponame:DIGITAL.CSIC. Repositorio Institucional del CSICinstname:Consejo Superior de Investigaciones Científicas (CSIC)Inglés#PLACEHOLDER_PARENT_METADATA_VALUE#info:eu-repo/grantAgreement/MINECO/Plan Estatal de Investigación Científica y Técnica y de Innovación 2013-2016/MAT2013-48054-C2http://doi.org/10.3762/bjnano.7.100Síinfo:eu-repo/semantics/openAccessoai:digital.csic.es:10261/1860782026-05-22T06:33:51Z
dc.title.none.fl_str_mv Customized MFM probes with high lateral resolution
title Customized MFM probes with high lateral resolution
spellingShingle Customized MFM probes with high lateral resolution
Iglesias-Freire, Óscar
Atomic force microscopy
Magnetic materials
Magnetic force microscopy (MFM)
High-resolution microscopy
AFM probes
title_short Customized MFM probes with high lateral resolution
title_full Customized MFM probes with high lateral resolution
title_fullStr Customized MFM probes with high lateral resolution
title_full_unstemmed Customized MFM probes with high lateral resolution
title_sort Customized MFM probes with high lateral resolution
dc.creator.none.fl_str_mv Iglesias-Freire, Óscar
Jaafar, Miriam
Berganza, Eider
Asenjo Barahona, Agustina
author Iglesias-Freire, Óscar
author_facet Iglesias-Freire, Óscar
Jaafar, Miriam
Berganza, Eider
Asenjo Barahona, Agustina
author_role author
author2 Jaafar, Miriam
Berganza, Eider
Asenjo Barahona, Agustina
author2_role author
author
author
dc.contributor.none.fl_str_mv Ministerio de Economía y Competitividad (España)
Ministerio de Ciencia e Innovación (España)
Consejo Superior de Investigaciones Científicas [https://ror.org/02gfc7t72]
dc.subject.none.fl_str_mv Atomic force microscopy
Magnetic materials
Magnetic force microscopy (MFM)
High-resolution microscopy
AFM probes
topic Atomic force microscopy
Magnetic materials
Magnetic force microscopy (MFM)
High-resolution microscopy
AFM probes
description Magnetic force microscopy (MFM) is a widely used technique for magnetic imaging. Besides its advantages such as the high spatial resolution and the easy use in the characterization of relevant applied materials, the main handicaps of the technique are the lack of control over the tip stray field and poor lateral resolution when working under standard conditions. In this work, we present a convenient route to prepare high-performance MFM probes with sub-10 nm (sub-25 nm) topographic (magnetic) lateral resolution by following an easy and quick low-cost approach. This allows one to not only customize the tip stray field, avoiding tip-induced changes in the sample magnetization, but also to optimize MFM imaging in vacuum (or liquid media) by choosing tips mounted on hard (or soft) cantilevers, a technology that is currently not available on the market.
publishDate 2016
dc.date.none.fl_str_mv 2016
2019
2019
2019
dc.type.none.fl_str_mv info:eu-repo/semantics/article
http://purl.org/coar/resource_type/c_6501
Publisher's version
info:eu-repo/semantics/publishedVersion
format article
status_str publishedVersion
dc.identifier.none.fl_str_mv http://hdl.handle.net/10261/186078
url http://hdl.handle.net/10261/186078
dc.language.none.fl_str_mv Inglés
language_invalid_str_mv Inglés
dc.relation.none.fl_str_mv #PLACEHOLDER_PARENT_METADATA_VALUE#
info:eu-repo/grantAgreement/MINECO/Plan Estatal de Investigación Científica y Técnica y de Innovación 2013-2016/MAT2013-48054-C2
http://doi.org/10.3762/bjnano.7.100
Sí
dc.rights.none.fl_str_mv info:eu-repo/semantics/openAccess
eu_rights_str_mv openAccess
dc.publisher.none.fl_str_mv Beilstein Institut
publisher.none.fl_str_mv Beilstein Institut
dc.source.none.fl_str_mv reponame:DIGITAL.CSIC. Repositorio Institucional del CSIC
instname:Consejo Superior de Investigaciones Científicas (CSIC)
instname_str Consejo Superior de Investigaciones Científicas (CSIC)
reponame_str DIGITAL.CSIC. Repositorio Institucional del CSIC
collection DIGITAL.CSIC. Repositorio Institucional del CSIC
repository.name.fl_str_mv
repository.mail.fl_str_mv
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score 15.81155

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