Electron Energy Loss Spectroscopy Solutions for Nanoscale Materials Science Problems

[eng] In the Transmission Electron Microscope (TEM), an incident electron suffers both elastic and inelastic scattering by the solid state thin sample that is being characterised. In the event of inelastic scattering, the incident electron gives a part of its energy to the electrons in the sample. T...

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Detalles Bibliográficos
Autor: Estradé Albiol, Sònia
Tipo de recurso: tesis doctoral
Estado:Versión publicada
Fecha de publicación:2009
País:España
Institución:Universidad de Barcelona
Repositorio:Dipòsit Digital de la UB
OAI Identifier:oai:diposit.ub.edu:2445/124947
Acceso en línea:https://hdl.handle.net/2445/124947
http://hdl.handle.net/10803/662847
Access Level:acceso abierto
Palabra clave:Espectroscòpia de pèrdua d'energia d'electrons
Nanotecnologia
Electron energy loss spectroscopy
Nanotechnology
Descripción
Sumario:[eng] In the Transmission Electron Microscope (TEM), an incident electron suffers both elastic and inelastic scattering by the solid state thin sample that is being characterised. In the event of inelastic scattering, the incident electron gives a part of its energy to the electrons in the sample. The amount of lost energy can then be measured by a magnetic filter at the end of the column, and a plot displaying how many electrons have lost what amount of energy will give us an Electron Energy Loss (EEL) Spectrum. Thus, in an EEL Spectrum the ordinate axis corresponds to the number of electrons, or counts, and the abscise corresponds to the Energy Loss. Notice that most electrons shall not suffer any inelastic scattering whatsoever. As a consequence, the greatest contribution to the spectrum is due to these electrons having lost zero energy, giving rise to the so-called zero loss peak (ZLP). As for those electrons having lost a certain amount of energy, they may lose it to ionization of specimen electrons, transitions from occupied core states to unoccupied core states or to conduction band states, to interband transitions or excitations of collective vibrations of conduction band electrons. Incident electrons carry a given momentum, and it is worth keeping in mind that in an inelastic scattering event not only energy, but also momentum, may be transferred. In fact, this is the reason why it is not straightforward to compare EELS results with those obtained by means of optic spectroscopies. EELS detectors can provide an energy resolution down to the order of the 0.1 eV. In addition, incident electrons can be tuned by TEM optics, making it possible to get spectroscopic information from an extremely constrained area, and to combine EEL Spectroscopy with TEM imaging.