Nondestructive thickness measurement of biological layers at the nanoscale by simultaneous topography and capacitance imaging

Nanoscale capacitance images of purple membrane layers are obtained simultaneously to topography in a nondestructive manner by operating alternating current sensing atomic force microscopy in jumping mode. Capacitance images show excellent agreement with theoretical modeling and prove to be a noninv...

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Bibliographic Details
Authors: Casuso, Ignacio|||0000-0001-7192-0136, Fumagalli, Laura, Gomila, Gabriel|||0000-0002-1949-1757, Padrós, Esteve
Format: article
Publication Date:2007
Country:España
Institution:Universitat Autònoma de Barcelona
Repository:Dipòsit Digital de Documents de la UAB
Language:English
OAI Identifier:oai:ddd.uab.cat:116061
Online Access:https://ddd.uab.cat/record/116061
https://dx.doi.org/urn:doi:10.1063/1.2767979
Access Level:Open access
Keyword:Capacitance
Electric measurements
Bioelectrochemistry
Topography
Gold
Atomic force microscopy
Monolayers
Alternating current power transmission
Nanomaterials
Spatial resolution
Description
Summary:Nanoscale capacitance images of purple membrane layers are obtained simultaneously to topography in a nondestructive manner by operating alternating current sensing atomic force microscopy in jumping mode. Capacitance images show excellent agreement with theoretical modeling and prove to be a noninvasive method for measuring the thickness of purple membrane layers beyond the single monolayer limit with nanoscale lateral spatial resolution. With the ability of spatially resolving the capacitance while preserving the sample from damaging, this technique can be applied for nanoscale thickness measurement of other biological layers and soft materials in general.