Electrokinetic Biased Deterministic Lateral Displacement: Scaling Analysis and Simulations

Deterministic Lateral Displacement (DLD) is a microfluidic technique where arrays of micropillars within a microchannel deflect particles leading to size-based segregation. We recently demonstrated that applying AC electric fields orthogonal to the fluid flow increases the separation capabilities of...

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Autores: Calero, Victor, García Sánchez, Pablo, Ramos Reyes, Antonio, Morgan, Hywel
Formato: artículo
Estado:Versión aceptada para publicación
Fecha de publicación:2020
País:España
Recursos:Universidad de Sevilla (US)
Repositorio:idUS. Depósito de Investigación de la Universidad de Sevilla
OAI Identifier:oai:idus.us.es:11441/142924
Acesso em linha:https://hdl.handle.net/11441/142924
https://doi.org/10.1016/j.chroma.2020.461151
Access Level:acceso abierto
Palavra-chave:Dielectrophoresis
Electric fields
Electrokinetics
Electrophoresis
Microfluidics
Microparticles
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spelling Electrokinetic Biased Deterministic Lateral Displacement: Scaling Analysis and SimulationsCalero, VictorGarcía Sánchez, PabloRamos Reyes, AntonioMorgan, HywelDielectrophoresisElectric fieldsElectrokineticsElectrophoresisMicrofluidicsMicroparticlesDeterministic Lateral Displacement (DLD) is a microfluidic technique where arrays of micropillars within a microchannel deflect particles leading to size-based segregation. We recently demonstrated that applying AC electric fields orthogonal to the fluid flow increases the separation capabilities of these devices with a deflection angle that depends on the electric field magnitude and frequency. Particle deviation occurs in two distinct regimes depending on frequency. At high frequencies particles deviate due to negative dielectrophoresis (DEP). At low frequencies (below 1 kHz) particles oscillate perpendicular to the flow direction due to electrophoresis and are also deflected within the device. Significantly, the threshold electric field magnitude for the low frequency deviation is much lower than for deflection at high frequencies by DEP. In order to characterize the enhanced separation at low frequencies, the induced deviation was compared between the two frequency ranges. For high frequencies, we develop both theoretically and experimentally scaling laws for the dependence of particle deviation on several parameters, namely the amplitude of the applied voltage, particle size and liquid velocity where DEP forces compete with viscous drag. A novel theoretical framework is presented that enables simulation of particle trajectories subjected to DEP forces in DLD devices. Deviation angles predicted by simulations are in very good agreement with experimental data. At low frequencies (below 1 kHz), particles follow the same scaling law, but with much lower voltages. This indicates that electrokinetic phenomena other than DEP play an important role in driving particle behaviour. Experiments show that at low frequencies, particle motion is affected by quadrupolar electrohydrodynamic flows around the insulating pillars of the DLD array. We quantify the difference between the two frequency regimes and show that an electrokinetic model based only on DEP forces is limited to frequencies of 1 kHz and above.Agencia Estatal de Investigación PGC2018-099217-B-I00ElsevierElectrónica y ElectromagnetismoAgencia Estatal de Investigación. España2020info:eu-repo/semantics/articleinfo:eu-repo/semantics/acceptedVersionapplication/pdfapplication/pdfhttps://hdl.handle.net/11441/142924https://doi.org/10.1016/j.chroma.2020.461151reponame:idUS. Depósito de Investigación de la Universidad de Sevillainstname:Universidad de Sevilla (US)InglésJournal of Chromatography A, 1623, 461151.PGC2018-099217-B-I00https://dx.doi.org/10.1016/j.chroma.2020.461151info:eu-repo/semantics/openAccessoai:idus.us.es:11441/1429242026-06-17T12:51:07Z
dc.title.none.fl_str_mv Electrokinetic Biased Deterministic Lateral Displacement: Scaling Analysis and Simulations
title Electrokinetic Biased Deterministic Lateral Displacement: Scaling Analysis and Simulations
spellingShingle Electrokinetic Biased Deterministic Lateral Displacement: Scaling Analysis and Simulations
Calero, Victor
Dielectrophoresis
Electric fields
Electrokinetics
Electrophoresis
Microfluidics
Microparticles
title_short Electrokinetic Biased Deterministic Lateral Displacement: Scaling Analysis and Simulations
title_full Electrokinetic Biased Deterministic Lateral Displacement: Scaling Analysis and Simulations
title_fullStr Electrokinetic Biased Deterministic Lateral Displacement: Scaling Analysis and Simulations
title_full_unstemmed Electrokinetic Biased Deterministic Lateral Displacement: Scaling Analysis and Simulations
title_sort Electrokinetic Biased Deterministic Lateral Displacement: Scaling Analysis and Simulations
dc.creator.none.fl_str_mv Calero, Victor
García Sánchez, Pablo
Ramos Reyes, Antonio
Morgan, Hywel
author Calero, Victor
author_facet Calero, Victor
García Sánchez, Pablo
Ramos Reyes, Antonio
Morgan, Hywel
author_role author
author2 García Sánchez, Pablo
Ramos Reyes, Antonio
Morgan, Hywel
author2_role author
author
author
dc.contributor.none.fl_str_mv Electrónica y Electromagnetismo
Agencia Estatal de Investigación. España
dc.subject.none.fl_str_mv Dielectrophoresis
Electric fields
Electrokinetics
Electrophoresis
Microfluidics
Microparticles
topic Dielectrophoresis
Electric fields
Electrokinetics
Electrophoresis
Microfluidics
Microparticles
description Deterministic Lateral Displacement (DLD) is a microfluidic technique where arrays of micropillars within a microchannel deflect particles leading to size-based segregation. We recently demonstrated that applying AC electric fields orthogonal to the fluid flow increases the separation capabilities of these devices with a deflection angle that depends on the electric field magnitude and frequency. Particle deviation occurs in two distinct regimes depending on frequency. At high frequencies particles deviate due to negative dielectrophoresis (DEP). At low frequencies (below 1 kHz) particles oscillate perpendicular to the flow direction due to electrophoresis and are also deflected within the device. Significantly, the threshold electric field magnitude for the low frequency deviation is much lower than for deflection at high frequencies by DEP. In order to characterize the enhanced separation at low frequencies, the induced deviation was compared between the two frequency ranges. For high frequencies, we develop both theoretically and experimentally scaling laws for the dependence of particle deviation on several parameters, namely the amplitude of the applied voltage, particle size and liquid velocity where DEP forces compete with viscous drag. A novel theoretical framework is presented that enables simulation of particle trajectories subjected to DEP forces in DLD devices. Deviation angles predicted by simulations are in very good agreement with experimental data. At low frequencies (below 1 kHz), particles follow the same scaling law, but with much lower voltages. This indicates that electrokinetic phenomena other than DEP play an important role in driving particle behaviour. Experiments show that at low frequencies, particle motion is affected by quadrupolar electrohydrodynamic flows around the insulating pillars of the DLD array. We quantify the difference between the two frequency regimes and show that an electrokinetic model based only on DEP forces is limited to frequencies of 1 kHz and above.
publishDate 2020
dc.date.none.fl_str_mv 2020
dc.type.none.fl_str_mv info:eu-repo/semantics/article
info:eu-repo/semantics/acceptedVersion
format article
status_str acceptedVersion
dc.identifier.none.fl_str_mv https://hdl.handle.net/11441/142924
https://doi.org/10.1016/j.chroma.2020.461151
url https://hdl.handle.net/11441/142924
https://doi.org/10.1016/j.chroma.2020.461151
dc.language.none.fl_str_mv Inglés
language_invalid_str_mv Inglés
dc.relation.none.fl_str_mv Journal of Chromatography A, 1623, 461151.
PGC2018-099217-B-I00
https://dx.doi.org/10.1016/j.chroma.2020.461151
dc.rights.none.fl_str_mv info:eu-repo/semantics/openAccess
eu_rights_str_mv openAccess
dc.format.none.fl_str_mv application/pdf
application/pdf
dc.publisher.none.fl_str_mv Elsevier
publisher.none.fl_str_mv Elsevier
dc.source.none.fl_str_mv reponame:idUS. Depósito de Investigación de la Universidad de Sevilla
instname:Universidad de Sevilla (US)
instname_str Universidad de Sevilla (US)
reponame_str idUS. Depósito de Investigación de la Universidad de Sevilla
collection idUS. Depósito de Investigación de la Universidad de Sevilla
repository.name.fl_str_mv
repository.mail.fl_str_mv
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score 15,300719

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