Isolation and characterization of few-layer black phosphorus

This is the post-peer reviewed version of the following article: A. Castellanos-Gomez et al. “Isolation and characterization of few-layer black phosphorus”. 2D Matererials, 2014, 1(2) 025001 doi:10.1088/2053-1583/1/2/025001 Which has been published in final form at: http://iopscience.iop.org/2053-15...

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Detalhes bibliográficos
Autores: Castellanos-Gomez, Andres, Vicarelli, Leonardo, Prada, Elsa, Island, Joshua O., Narasimha-Acharya, K. L., Blanter, Sofya I., Groenendijk, Dirk J., Buscema, Michele, Steele, Gary A., Alvarez, J. V., Zandbergen, Henny W., Palacios Burgos, Juan José, Van Der Zant, Herre S J
Formato: artículo
Fecha de publicación:2014
País:España
Recursos:Universidad Autónoma de Madrid
Repositorio:Biblos-e Archivo. Repositorio Institucional de la UAM
Idioma:inglés
OAI Identifier:oai:repositorio.uam.es:10486/669327
Acesso em linha:http://hdl.handle.net/10486/669327
https://dx.doi.org/10.1088/2053-1583/1/2/025001
Access Level:acceso abierto
Palavra-chave:Black phosphorus
Raman spectroscopy
Mechanical exfoliation
Transmission electron microscopy
Density functional theory
Band structure
Exciton
Field-effect transistor
Física
Descrição
Resumo:This is the post-peer reviewed version of the following article: A. Castellanos-Gomez et al. “Isolation and characterization of few-layer black phosphorus”. 2D Matererials, 2014, 1(2) 025001 doi:10.1088/2053-1583/1/2/025001 Which has been published in final form at: http://iopscience.iop.org/2053-1583/1/2/025001

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