Cita APA

Crespo Yepes, A., Ramos Hortal, R., Barajas Ojeda, E., Aragonès Cervera, X., Mateo Peña, D., Martin Martínez, J., . . . Nafría Maqueda, M. (2021). Modeling of the degradation of CMOS inverters under pulsed stress conditions from ‘on-the-fly’ measurements.

Citación estilo Chicago

Crespo Yepes, Albert, Regina Ramos Hortal, Enrique|||0000-0002-2072-2268 Barajas Ojeda, Xavier|||0000-0003-1352-8675 Aragonès Cervera, Diego|||0000-0001-5996-9092 Mateo Peña, Javier Martin Martínez, Rosana Rodríguez Martínez, y Montserrat|||0000-0002-9549-2890 Nafría Maqueda. Modeling of the Degradation of CMOS Inverters Under Pulsed Stress Conditions From ‘on-the-fly’ Measurements. 2021.

Cita MLA

Crespo Yepes, Albert, et al. Modeling of the Degradation of CMOS Inverters Under Pulsed Stress Conditions From ‘on-the-fly’ Measurements. 2021.