Implementation of Waveguide Terminations With Low-Passive Intermodulation for Conducted Test Beds in Backward Configuration

[EN] This letter proposes a simple procedure to implement low-passive intermodulation (PIM) terminations in waveguide technology to measure conducted backward PIM. The procedure consists in inserting a filter before the waveguide termination of the test bench. This approach reduces the PIM contribut...

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Detalles Bibliográficos
Autores: Smacchia, Davide, Guglielmi, Marco, Raboso, David, Soto Pacheco, Pablo|||0000-0002-2734-620X, Morro, J. V.|||0000-0002-4699-6208, Boria Esbert, Vicente Enrique|||0000-0001-7150-9785
Tipo de recurso: artículo
Fecha de publicación:2019
País:España
Institución:Universitat Politècnica de València (UPV)
Repositorio:RiuNet. Repositorio Institucional de la Universitat Politécnica de Valéncia
Idioma:inglés
OAI Identifier:oai:riunet.upv.es:10251/157296
Acceso en línea:https://riunet.upv.es/handle/10251/157296
Access Level:acceso abierto
Palabra clave:Intermodulation distorsion
Low-pass filters
Microwave filters
Passive circuits
PIM mitigation
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Descripción
Sumario:[EN] This letter proposes a simple procedure to implement low-passive intermodulation (PIM) terminations in waveguide technology to measure conducted backward PIM. The procedure consists in inserting a filter before the waveguide termination of the test bench. This approach reduces the PIM contribution from the load and, consequently, lowers the residual PIM noise floor of the test bench. To validate the procedure, a conducted backward low-PIM setup working in K-band has been assembled and tested. The PIM performance improvement obtained fully confirms the validity of the proposed solution.