Aberration-corrected transmission electron microscopy with Zernike phase plates

We explore the possibility of applying physical phase plates (PPs) in combination with aberration-corrected transmission electron microscopy. Phase-contrast transfer characteristics are calculated and compared for a thin-film based Zernike PP, a hole-free (HF) or Volta PP and an electrostatic Zach P...

ver descrição completa

Detalhes bibliográficos
Autores: Hettler, Simon, Arenal, Raúl
Tipo de documento: artigo
Estado:Versão publicada
Data de publicação:2022
País:España
Recursos:Consejo Superior de Investigaciones Científicas (CSIC)
Repositório:DIGITAL.CSIC. Repositorio Institucional del CSIC
OAI Identifier:oai:digital.csic.es:10261/280144
Acesso em linha:http://hdl.handle.net/10261/280144
Access Level:Acceso aberto
Palavra-chave:Aberration-corrected transmission electron microscopy
Physical phase plate
Phase contrast
Material science
Nanomaterials
id ES_dd6b2977b896c7279451f95fa5e4e4be
oai_identifier_str oai:digital.csic.es:10261/280144
network_acronym_str ES
network_name_str España
repository_id_str
spelling Aberration-corrected transmission electron microscopy with Zernike phase platesHettler, SimonArenal, RaúlAberration-corrected transmission electron microscopyPhysical phase platePhase contrastMaterial scienceNanomaterialsWe explore the possibility of applying physical phase plates (PPs) in combination with aberration-corrected transmission electron microscopy. Phase-contrast transfer characteristics are calculated and compared for a thin-film based Zernike PP, a hole-free (HF) or Volta PP and an electrostatic Zach PP, considering their phase-shifting properties in combination with partial spatial coherence. The effect of slightly converging illumination conditions, often used in high-resolution applications, on imaging with PPs is discussed. Experiments with an unheated Zernike PP applied to various nanomaterial specimens and a qualitative analysis clearly demonstrates the general compatibility of PPs and aberration-corrected transmission electron microscopy. Calculations and experiments show the benefits of the approach, among which is a strong phase-contrast enhancement of a large range of spatial frequencies. This allows the simultaneous imaging of atomic-resolution structures and morphological features at the nanometer scale, with maximum phase contrast. The calculations can explain why the HFPP damps contrast transfer at higher spatial frequencies.The authors acknowledge funding by German Research Foundation (DFG project He 7675/1-1), from the European Union’s Horizon 2020 research and innovation programme under the Marie Sklodowska-Curie grant agreement No 889546, by the Spanish MICINN (PID2019-104739GB-100/AEI/10.13039/501100011033), by the Government of Aragòn (Project DGA E13-20R) and from the European Union H2020 programs ”ESTEEM3” (Grant number 823717) and ”Graphene Flagship” CORE 3 (Grant number 881603).Peer reviewedElsevierGerman Research FoundationEuropean CommissionMinisterio de Ciencia, Innovación y Universidades (España)Agencia Estatal de Investigación (España)Gobierno de AragónConsejo Superior de Investigaciones Científicas [https://ror.org/02gfc7t72]202220222022info:eu-repo/semantics/articlehttp://purl.org/coar/resource_type/c_6501Publisher's versioninfo:eu-repo/semantics/publishedVersionhttp://hdl.handle.net/10261/280144reponame:DIGITAL.CSIC. Repositorio Institucional del CSICinstname:Consejo Superior de Investigaciones Científicas (CSIC)Inglés#PLACEHOLDER_PARENT_METADATA_VALUE##PLACEHOLDER_PARENT_METADATA_VALUE##PLACEHOLDER_PARENT_METADATA_VALUE##PLACEHOLDER_PARENT_METADATA_VALUE#info:eu-repo/grantAgreement/EC/H2020/889546info:eu-repo/grantAgreement/AEI/Plan Estatal de Investigación Científica y Técnica y de Innovación 2017-2020/PID2019-104739GB-I00info:eu-repo/grantAgreement/EC/H2020/823717info:eu-repo/grantAgreement/EC/H2020/881603https://doi.org/10.1016/j.ultramic.2022.113564Síinfo:eu-repo/semantics/openAccessoai:digital.csic.es:10261/2801442026-05-22T06:33:51Z
dc.title.none.fl_str_mv Aberration-corrected transmission electron microscopy with Zernike phase plates
title Aberration-corrected transmission electron microscopy with Zernike phase plates
spellingShingle Aberration-corrected transmission electron microscopy with Zernike phase plates
Hettler, Simon
Aberration-corrected transmission electron microscopy
Physical phase plate
Phase contrast
Material science
Nanomaterials
title_short Aberration-corrected transmission electron microscopy with Zernike phase plates
title_full Aberration-corrected transmission electron microscopy with Zernike phase plates
title_fullStr Aberration-corrected transmission electron microscopy with Zernike phase plates
title_full_unstemmed Aberration-corrected transmission electron microscopy with Zernike phase plates
title_sort Aberration-corrected transmission electron microscopy with Zernike phase plates
dc.creator.none.fl_str_mv Hettler, Simon
Arenal, Raúl
author Hettler, Simon
author_facet Hettler, Simon
Arenal, Raúl
author_role author
author2 Arenal, Raúl
author2_role author
dc.contributor.none.fl_str_mv German Research Foundation
European Commission
Ministerio de Ciencia, Innovación y Universidades (España)
Agencia Estatal de Investigación (España)
Gobierno de Aragón
Consejo Superior de Investigaciones Científicas [https://ror.org/02gfc7t72]
dc.subject.none.fl_str_mv Aberration-corrected transmission electron microscopy
Physical phase plate
Phase contrast
Material science
Nanomaterials
topic Aberration-corrected transmission electron microscopy
Physical phase plate
Phase contrast
Material science
Nanomaterials
description We explore the possibility of applying physical phase plates (PPs) in combination with aberration-corrected transmission electron microscopy. Phase-contrast transfer characteristics are calculated and compared for a thin-film based Zernike PP, a hole-free (HF) or Volta PP and an electrostatic Zach PP, considering their phase-shifting properties in combination with partial spatial coherence. The effect of slightly converging illumination conditions, often used in high-resolution applications, on imaging with PPs is discussed. Experiments with an unheated Zernike PP applied to various nanomaterial specimens and a qualitative analysis clearly demonstrates the general compatibility of PPs and aberration-corrected transmission electron microscopy. Calculations and experiments show the benefits of the approach, among which is a strong phase-contrast enhancement of a large range of spatial frequencies. This allows the simultaneous imaging of atomic-resolution structures and morphological features at the nanometer scale, with maximum phase contrast. The calculations can explain why the HFPP damps contrast transfer at higher spatial frequencies.
publishDate 2022
dc.date.none.fl_str_mv 2022
2022
2022
dc.type.none.fl_str_mv info:eu-repo/semantics/article
http://purl.org/coar/resource_type/c_6501
Publisher's version
info:eu-repo/semantics/publishedVersion
format article
status_str publishedVersion
dc.identifier.none.fl_str_mv http://hdl.handle.net/10261/280144
url http://hdl.handle.net/10261/280144
dc.language.none.fl_str_mv Inglés
language_invalid_str_mv Inglés
dc.relation.none.fl_str_mv #PLACEHOLDER_PARENT_METADATA_VALUE#
#PLACEHOLDER_PARENT_METADATA_VALUE#
#PLACEHOLDER_PARENT_METADATA_VALUE#
#PLACEHOLDER_PARENT_METADATA_VALUE#
info:eu-repo/grantAgreement/EC/H2020/889546
info:eu-repo/grantAgreement/AEI/Plan Estatal de Investigación Científica y Técnica y de Innovación 2017-2020/PID2019-104739GB-I00
info:eu-repo/grantAgreement/EC/H2020/823717
info:eu-repo/grantAgreement/EC/H2020/881603
https://doi.org/10.1016/j.ultramic.2022.113564
Sí
dc.rights.none.fl_str_mv info:eu-repo/semantics/openAccess
eu_rights_str_mv openAccess
dc.publisher.none.fl_str_mv Elsevier
publisher.none.fl_str_mv Elsevier
dc.source.none.fl_str_mv reponame:DIGITAL.CSIC. Repositorio Institucional del CSIC
instname:Consejo Superior de Investigaciones Científicas (CSIC)
instname_str Consejo Superior de Investigaciones Científicas (CSIC)
reponame_str DIGITAL.CSIC. Repositorio Institucional del CSIC
collection DIGITAL.CSIC. Repositorio Institucional del CSIC
repository.name.fl_str_mv
repository.mail.fl_str_mv
_version_ 1869421858479144960
score 15,812455

Registros relacionados