Enhanced FEM-based DBIM approach for two-dimensional microwave imaging
© 2020 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to...
| Autores: | , , |
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| Tipo de recurso: | artículo |
| Fecha de publicación: | 2021 |
| País: | España |
| Institución: | Universidad Autónoma de Madrid |
| Repositorio: | Biblos-e Archivo. Repositorio Institucional de la UAM |
| Idioma: | inglés |
| OAI Identifier: | oai:repositorio.uam.es:10486/710404 |
| Acceso en línea: | http://hdl.handle.net/10486/710404 https://dx.doi.org/10.1109/TAP.2020.3044806 |
| Access Level: | acceso abierto |
| Palabra clave: | Distorted Born iterative method microwave imaging finite element method electromagnetic inverse scattering problem microwave tomography Telecomunicaciones |
| Sumario: | © 2020 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works. |
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