Determination of the length of single-walled carbon nanotubes by scanning electron microscopy
A methodology is presented to determine the length of well individualized single-walled carbon nanotubes (SWCNTs) by means of scanning electron microscopy (SEM). Accurate measurements on wide areas of the sample can be achieved in an easy, fast and trustworthy manner. We have tested several supports...
| Autores: | , , , , |
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| Tipo de recurso: | artículo |
| Fecha de publicación: | 2018 |
| País: | España |
| Institución: | Universitat Autònoma de Barcelona |
| Repositorio: | Dipòsit Digital de Documents de la UAB |
| Idioma: | inglés |
| OAI Identifier: | oai:ddd.uab.cat:204835 |
| Acceso en línea: | https://ddd.uab.cat/record/204835 https://dx.doi.org/urn:doi:10.1016/j.mex.2018.11.004 |
| Access Level: | acceso abierto |
| Palabra clave: | Dispersion Length distribution Shortening Cutting Atomic force microscopy |
| Sumario: | A methodology is presented to determine the length of well individualized single-walled carbon nanotubes (SWCNTs) by means of scanning electron microscopy (SEM). Accurate measurements on wide areas of the sample can be achieved in an easy, fast and trustworthy manner. We have tested several supports and solvents to optimize the dispersion of SWCNTs, as well as the SEM imaging conditions. The optimal methodology goes via dispersion of the sample in ortho-dichlorobenzene, deposition onto a continuous carbon film supported on a copper TEM grid, and SEM imaging at 2 kV in secondary electrons mode using a through-in-lens detector. • Individualization of SWCNTs is achieved by dispersion of SWCNTs in ortho-dichlorobenzene and deposition onto TEM grids• Individual SWCNTs are imaged by SEM• Length determination by SEM is as precise as AFM |
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