Oxide Breakdown Spot Spatial Patterns as Fingerprints for Optical Physical Unclonable Functions

Dielectric Breakdown (BD) of the gate oxide in a Metal-Insulator-Semiconductor (MIS) or Metal-Insulator-Metal (MIM) structure has been traditionally considered a major drawback since such event can seriously affect the electrical performance of the circuit containing the device. However, since BD is...

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Autores: Porti i Pujal, Marc|||0000-0001-7438-3823, Redon, Miquel, Muñoz Gorriz, Jordi|||0000-0003-4101-5009, Nafria, Montserrat|||0000-0002-9549-2890, Miranda, E.|||0000-0003-0470-5318
Tipo de recurso: artículo
Fecha de publicación:2023
País:España
Institución:Universitat Autònoma de Barcelona
Repositorio:Dipòsit Digital de Documents de la UAB
Idioma:inglés
OAI Identifier:oai:ddd.uab.cat:283102
Acceso en línea:https://ddd.uab.cat/record/283102
https://dx.doi.org/urn:doi:10.1109/LED.2023.3301974
Access Level:acceso abierto
Palabra clave:Capacitors
Cryptography
Dielectric Breakdown
Fingerprint recognition
Logic gates
MIM devices
Optical imaging
PUF
Reproducibility of results
Stress
id ES_d822cbdccdcdbfa4956166f6b42e821b
oai_identifier_str oai:ddd.uab.cat:283102
network_acronym_str ES
network_name_str España
repository_id_str
spelling Oxide Breakdown Spot Spatial Patterns as Fingerprints for Optical Physical Unclonable FunctionsPorti i Pujal, Marc|||0000-0001-7438-3823Redon, MiquelMuñoz Gorriz, Jordi|||0000-0003-4101-5009Nafria, Montserrat|||0000-0002-9549-2890Miranda, E.|||0000-0003-0470-5318CapacitorsCryptographyDielectric BreakdownFingerprint recognitionLogic gatesMIM devicesOptical imagingPUFReproducibility of resultsStressDielectric Breakdown (BD) of the gate oxide in a Metal-Insulator-Semiconductor (MIS) or Metal-Insulator-Metal (MIM) structure has been traditionally considered a major drawback since such event can seriously affect the electrical performance of the circuit containing the device. However, since BD is an inherently random process, when externally detectable by optical means, the phenomenon can be used to generate cryptographic keys for Physically Unclonable Functions (PUFs). This is the case discussed here. Images containing BD spot spatial distributions in MIM devices were binarized and their uniformity, uniqueness and reproducibility evaluated as fingerprints for security applications such as anti-counterfeiting purposes, secure identification and authentication of components. The obtained results are highly promising since it is demonstrated that the generated fingerprints meet all the mandatory requirements for PUFs, indicating that the proposed approach is potentially useful for this kind of applications. 22023-01-0120232023-01-01Articlehttp://purl.org/coar/resource_type/c_6501AMhttp://purl.org/coar/version/c_ab4af688f83e57aainfo:eu-repo/semantics/articleapplication/pdfhttps://ddd.uab.cat/record/283102https://dx.doi.org/urn:doi:10.1109/LED.2023.3301974reponame:Dipòsit Digital de Documents de la UABinstname:Universitat Autònoma de BarcelonaInglésengopen accesshttp://purl.org/coar/access_right/c_abf2Aquest material està protegit per drets d'autor i/o drets afins. Podeu utilitzar aquest material en funció del que permet la legislació de drets d'autor i drets afins d'aplicació al vostre cas. Per a d'altres usos heu d'obtenir permís del(s) titular(s) de drets.https://rightsstatements.org/vocab/InC/1.0/info:eu-repo/semantics/openAccessoai:ddd.uab.cat:2831022026-06-06T12:50:31Z
dc.title.none.fl_str_mv Oxide Breakdown Spot Spatial Patterns as Fingerprints for Optical Physical Unclonable Functions
title Oxide Breakdown Spot Spatial Patterns as Fingerprints for Optical Physical Unclonable Functions
spellingShingle Oxide Breakdown Spot Spatial Patterns as Fingerprints for Optical Physical Unclonable Functions
Porti i Pujal, Marc|||0000-0001-7438-3823
Capacitors
Cryptography
Dielectric Breakdown
Fingerprint recognition
Logic gates
MIM devices
Optical imaging
PUF
Reproducibility of results
Stress
title_short Oxide Breakdown Spot Spatial Patterns as Fingerprints for Optical Physical Unclonable Functions
title_full Oxide Breakdown Spot Spatial Patterns as Fingerprints for Optical Physical Unclonable Functions
title_fullStr Oxide Breakdown Spot Spatial Patterns as Fingerprints for Optical Physical Unclonable Functions
title_full_unstemmed Oxide Breakdown Spot Spatial Patterns as Fingerprints for Optical Physical Unclonable Functions
title_sort Oxide Breakdown Spot Spatial Patterns as Fingerprints for Optical Physical Unclonable Functions
dc.creator.none.fl_str_mv Porti i Pujal, Marc|||0000-0001-7438-3823
Redon, Miquel
Muñoz Gorriz, Jordi|||0000-0003-4101-5009
Nafria, Montserrat|||0000-0002-9549-2890
Miranda, E.|||0000-0003-0470-5318
author Porti i Pujal, Marc|||0000-0001-7438-3823
author_facet Porti i Pujal, Marc|||0000-0001-7438-3823
Redon, Miquel
Muñoz Gorriz, Jordi|||0000-0003-4101-5009
Nafria, Montserrat|||0000-0002-9549-2890
Miranda, E.|||0000-0003-0470-5318
author_role author
author2 Redon, Miquel
Muñoz Gorriz, Jordi|||0000-0003-4101-5009
Nafria, Montserrat|||0000-0002-9549-2890
Miranda, E.|||0000-0003-0470-5318
author2_role author
author
author
author
dc.subject.none.fl_str_mv Capacitors
Cryptography
Dielectric Breakdown
Fingerprint recognition
Logic gates
MIM devices
Optical imaging
PUF
Reproducibility of results
Stress
topic Capacitors
Cryptography
Dielectric Breakdown
Fingerprint recognition
Logic gates
MIM devices
Optical imaging
PUF
Reproducibility of results
Stress
description Dielectric Breakdown (BD) of the gate oxide in a Metal-Insulator-Semiconductor (MIS) or Metal-Insulator-Metal (MIM) structure has been traditionally considered a major drawback since such event can seriously affect the electrical performance of the circuit containing the device. However, since BD is an inherently random process, when externally detectable by optical means, the phenomenon can be used to generate cryptographic keys for Physically Unclonable Functions (PUFs). This is the case discussed here. Images containing BD spot spatial distributions in MIM devices were binarized and their uniformity, uniqueness and reproducibility evaluated as fingerprints for security applications such as anti-counterfeiting purposes, secure identification and authentication of components. The obtained results are highly promising since it is demonstrated that the generated fingerprints meet all the mandatory requirements for PUFs, indicating that the proposed approach is potentially useful for this kind of applications.
publishDate 2023
dc.date.none.fl_str_mv 2
2023-01-01
2023
2023-01-01
dc.type.none.fl_str_mv Article
http://purl.org/coar/resource_type/c_6501
AM
http://purl.org/coar/version/c_ab4af688f83e57aa
dc.type.openaire.fl_str_mv info:eu-repo/semantics/article
format article
dc.identifier.none.fl_str_mv https://ddd.uab.cat/record/283102
https://dx.doi.org/urn:doi:10.1109/LED.2023.3301974
url https://ddd.uab.cat/record/283102
https://dx.doi.org/urn:doi:10.1109/LED.2023.3301974
dc.language.none.fl_str_mv Inglés
eng
language_invalid_str_mv Inglés
language eng
dc.rights.none.fl_str_mv open access
http://purl.org/coar/access_right/c_abf2
https://rightsstatements.org/vocab/InC/1.0/
dc.rights.openaire.fl_str_mv info:eu-repo/semantics/openAccess
rights_invalid_str_mv open access
http://purl.org/coar/access_right/c_abf2
https://rightsstatements.org/vocab/InC/1.0/
eu_rights_str_mv openAccess
dc.format.none.fl_str_mv application/pdf
dc.source.none.fl_str_mv reponame:Dipòsit Digital de Documents de la UAB
instname:Universitat Autònoma de Barcelona
instname_str Universitat Autònoma de Barcelona
reponame_str Dipòsit Digital de Documents de la UAB
collection Dipòsit Digital de Documents de la UAB
repository.name.fl_str_mv
repository.mail.fl_str_mv
_version_ 1869421096170684416
score 15.301603