Wavefront measurements of imaging systems by comparing a point-diffraction interferometer and a Shack-Hartmann wavefront sensorp
In this work, we present a comparative study between two notorious techniques for wavefront characterization: Shack-Hartmann wavefront sensor and the Point-Diffraction Interferometer. The main goal of this work is to experimentally demonstrate the equivalence of results when wavefront characterizati...
| Autores: | , , |
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| Tipo de recurso: | artículo |
| Fecha de publicación: | 2018 |
| País: | España |
| Institución: | Universitat Politècnica de Catalunya (UPC) |
| Repositorio: | UPCommons. Portal del coneixement obert de la UPC |
| Idioma: | inglés |
| OAI Identifier: | oai:upcommons.upc.edu:2117/346090 |
| Acceso en línea: | https://hdl.handle.net/2117/346090 https://dx.doi.org/10.7149/OPA.51.2.50027 |
| Access Level: | acceso abierto |
| Palabra clave: | Optical detectors Optical Metrology Wavefront Aberrations Shack-Hartmann Interferometry Detectors òptics Àrees temàtiques de la UPC::Enginyeria electrònica::Instrumentació i mesura::Sensors i actuadors |
| Sumario: | In this work, we present a comparative study between two notorious techniques for wavefront characterization: Shack-Hartmann wavefront sensor and the Point-Diffraction Interferometer. The main goal of this work is to experimentally demonstrate the equivalence of results when wavefront characterization measurements are carried out for both techniques, within the experimental error, in the case of imaging systems. The study has been carried out in several commercial convergent lenses obtaining small root-mean-square difference between both techniques. The results aim the possibility to design a dual set-up combining both techniques with potential use in Ophthalmic applications. |
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